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Hendricks, R. W. (1972) A unified theory of absolute intensity measurements in small-angle X-ray scattering. Journal of Applied Crystallography, 5 (5) 315-324 doi:10.1107/s0021889872009690

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Reference TypeJournal (article/letter/editorial)
TitleA unified theory of absolute intensity measurements in small-angle X-ray scattering
JournalJournal of Applied Crystallography
AuthorsHendricks, R. W.Author
Year1972 (October 1)Volume5
Issue5
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s0021889872009690Search in ResearchGate
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Mindat Ref. ID463565Long-form Identifiermindat:1:5:463565:3
GUID0
Full ReferenceHendricks, R. W. (1972) A unified theory of absolute intensity measurements in small-angle X-ray scattering. Journal of Applied Crystallography, 5 (5) 315-324 doi:10.1107/s0021889872009690
Plain TextHendricks, R. W. (1972) A unified theory of absolute intensity measurements in small-angle X-ray scattering. Journal of Applied Crystallography, 5 (5) 315-324 doi:10.1107/s0021889872009690
In(1972, October) Journal of Applied Crystallography Vol. 5 (5) International Union of Crystallography (IUCr)

See Also

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Schelten, J., Hendricks, R. W. (1978) Recent developments in X-ray and neutron small-angle scattering instrumentation and data analysis. Journal of Applied Crystallography, 11 (5) 297-324 doi:10.1107/s0021889878013461
Shaffer, L. B., Beeman, W. W. (1970) Absolute power measurements in small angle X-ray scattering with gas scattering calibration. Journal of Applied Crystallography, 3 (5) 379-384 doi:10.1107/s0021889870006453
Hendricks, R. W. (1972) The role of Soller slits in small-angle scattering collimation systems. Journal of Applied Crystallography, 5 (4) 302-304 doi:10.1107/s0021889872009574
Perret, R., Ruland, W. (1972) X-ray small-angle scattering of glassy carbon. Journal of Applied Crystallography, 5 (3) 183-187 doi:10.1107/s0021889872009161
Hendricks, R. W. (1970) Two modifications of the Kratky small-angle X-ray camera. Journal of Applied Crystallography, 3 (5) 348-353 doi:10.1107/s0021889870006404
Russell, T. P. (1983) An absolute intensity standard for small-angle X-ray scattering measured with position-sensitive detectors. Journal of Applied Crystallography, 16 (5) 473-478 doi:10.1107/s0021889883010857
Liu, S., Moteff, J., Hendricks, R. W., Lin, J. S. (1978) Small-angle X-ray scattering studies of voids in neutron-irradiated molybdenum. Journal of Applied Crystallography, 11 (5) 597-602 doi:10.1107/s0021889878013928
Hendricks, R. W. (1978) The ORNL 10-meter small angle X-ray scattering camera. Journal of Applied Crystallography, 11 (1) 15-30 doi:10.1107/s0021889878012613
Bras, W., Ryan, A. J. (1997) Time-Resolved Small-Angle X-ray Scattering Combined with Wide-Angle X-ray Scattering. Journal of Applied Crystallography, 30 (5). 816-821 doi:10.1107/s0021889897001040
Buchanan, M. G., Hendricks, R. W. (1971) A program for the evaluation of weighting functions used in small-angle X-ray scattering. Journal of Applied Crystallography, 4 (2) 176-177 doi:10.1107/s0021889871006599
Parker, B. A. (1972) On the enhanced small-angle X-ray scattering from polished surfaces of aluminum. Journal of Applied Crystallography, 5 (5) 372-373 doi:10.1107/s0021889872009793
 
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