Hendrickson, Christopher L., Beu, Steven C., Blakney, Greg T., Marshall, Alan G. (2009) SIMION modeling of ion image charge detection in Fourier transform ion cyclotron resonance mass spectrometry. International Journal of Mass Spectrometry, 283 (1). 100-104 doi:10.1016/j.ijms.2009.02.009
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | SIMION modeling of ion image charge detection in Fourier transform ion cyclotron resonance mass spectrometry | ||
| Journal | International Journal of Mass Spectrometry | ||
| Authors | Hendrickson, Christopher L. | Author | |
| Beu, Steven C. | Author | ||
| Blakney, Greg T. | Author | ||
| Marshall, Alan G. | Author | ||
| Year | 2009 (June) | Volume | 283 |
| Issue | 1 | ||
| Publisher | Elsevier BV | ||
| DOI | doi:10.1016/j.ijms.2009.02.009Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 5367536 | Long-form Identifier | mindat:1:5:5367536:3 |
| GUID | 0 | ||
| Full Reference | Hendrickson, Christopher L., Beu, Steven C., Blakney, Greg T., Marshall, Alan G. (2009) SIMION modeling of ion image charge detection in Fourier transform ion cyclotron resonance mass spectrometry. International Journal of Mass Spectrometry, 283 (1). 100-104 doi:10.1016/j.ijms.2009.02.009 | ||
| Plain Text | Hendrickson, Christopher L., Beu, Steven C., Blakney, Greg T., Marshall, Alan G. (2009) SIMION modeling of ion image charge detection in Fourier transform ion cyclotron resonance mass spectrometry. International Journal of Mass Spectrometry, 283 (1). 100-104 doi:10.1016/j.ijms.2009.02.009 | ||
| In | (2009, June) International Journal of Mass Spectrometry Vol. 283 (1) Elsevier BV | ||
See Also
These are possibly similar items as determined by title/reference text matching only.
