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Bence, A. E., Albee, A. L. (1968) Empirical Correction Factors for the Electron Microanalysis of Silicates and Oxides. The Journal of Geology, 76 (4) 382-403 doi:10.1086/627339

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Reference TypeJournal (article/letter/editorial)
TitleEmpirical Correction Factors for the Electron Microanalysis of Silicates and Oxides
JournalThe Journal of Geology
AuthorsBence, A. E.Author
Albee, A. L.Author
Year1968 (July)Volume76
Page(s)382-403Issue4
PublisherUniversity of Chicago Press
DOIdoi:10.1086/627339Search in ResearchGate
Mindat Ref. ID167472Long-form Identifiermindat:1:5:167472:3
GUIDeb202829-f45a-400e-a0e1-331157d79e97
Full ReferenceBence, A. E., Albee, A. L. (1968) Empirical Correction Factors for the Electron Microanalysis of Silicates and Oxides. The Journal of Geology, 76 (4) 382-403 doi:10.1086/627339
Plain TextBence, A. E., Albee, A. L. (1968) Empirical Correction Factors for the Electron Microanalysis of Silicates and Oxides. The Journal of Geology, 76 (4) 382-403 doi:10.1086/627339
In(1968, July) The Journal of Geology Vol. 76 (4) University of Chicago Press

References Listed

These are the references the publisher has listed as being connected to the article. Please check the article itself for the full list of references which may differ. Not all references are currently linkable within the Digital Library.

HEINRICH K. F. () The electron microprobe: New York
HE (1949) Am. Mineralogist , 621
INGERSOLL R. M. () Advances in X-ray analysis, v. 9 , 273
KRACEK, F. C., and NEUVONEN, K. J., 1952, Thermochemistry of the plagioclase and alkali feldspars: Am. Jour. Sci., v. 302, no. 5 (Bowen volume), p.293-318.
LACHANCE G. R. (1966) I. Method: Canadian Spectroscopy , 43
Acta, v. 31, p.1091-1094.
TRAILL R. J. (1966) Canadian Spectroscopy , 63
ZIEBOLD T. O. (1966) The electron microprobe: New York


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