(1967) X-ray topographic observation of polytype distributions in silicon carbide. British Journal of Applied Physics, 18 (11) 1589-1659 doi:10.1088/0508-3443/18/11/312
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | X-ray topographic observation of polytype distributions in silicon carbide | ||
| Journal | British Journal of Applied Physics | ||
| Year | 1967 (November) | Volume | 18 |
| Issue | 11 | ||
| Publisher | IOP Publishing | ||
| DOI | doi:10.1088/0508-3443/18/11/312Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 10692383 | Long-form Identifier | mindat:1:5:10692383:2 |
| GUID | 0 | ||
| Full Reference | (1967) X-ray topographic observation of polytype distributions in silicon carbide. British Journal of Applied Physics, 18 (11) 1589-1659 doi:10.1088/0508-3443/18/11/312 | ||
| Plain Text | (1967) X-ray topographic observation of polytype distributions in silicon carbide. British Journal of Applied Physics, 18 (11) 1589-1659 doi:10.1088/0508-3443/18/11/312 | ||
| In | (1967, November) British Journal of Applied Physics Vol. 18 (11) IOP Publishing | ||
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