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Blake, F. C. (1933) On the Factors Affecting the Reflection Intensities by the Several Methods of X-Ray Analysis of Crystal Structures. Reviews of Modern Physics, 5 (3). 169-202 doi:10.1103/revmodphys.5.169

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Reference TypeJournal (article/letter/editorial)
TitleOn the Factors Affecting the Reflection Intensities by the Several Methods of X-Ray Analysis of Crystal Structures
JournalReviews of Modern Physics
AuthorsBlake, F. C.Author
Year1933 (July 1)Volume5
Issue3
PublisherAmerican Physical Society (APS)
DOIdoi:10.1103/revmodphys.5.169
Generate Citation Formats
Mindat Ref. ID10692676Long-form Identifiermindat:1:5:10692676:5
GUID0
Full ReferenceBlake, F. C. (1933) On the Factors Affecting the Reflection Intensities by the Several Methods of X-Ray Analysis of Crystal Structures. Reviews of Modern Physics, 5 (3). 169-202 doi:10.1103/revmodphys.5.169
Plain TextBlake, F. C. (1933) On the Factors Affecting the Reflection Intensities by the Several Methods of X-Ray Analysis of Crystal Structures. Reviews of Modern Physics, 5 (3). 169-202 doi:10.1103/revmodphys.5.169
In(1933, July) Reviews of Modern Physics Vol. 5 (3) American Physical Society (APS)


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