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Humble, P (1968) Computed Electron Micrographs for Tilted Foils Containing Dislocations and Stacking Faults. Australian Journal of Physics, 21 (3). 325pp. doi:10.1071/ph680325

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Reference TypeJournal (article/letter/editorial)
TitleComputed Electron Micrographs for Tilted Foils Containing Dislocations and Stacking Faults
JournalAustralian Journal of Physics
AuthorsHumble, PAuthor
Year1968Volume21
Issue3
PublisherCSIRO Publishing
DOIdoi:10.1071/ph680325Search in ResearchGate
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Mindat Ref. ID10697654Long-form Identifiermindat:1:5:10697654:8
GUID0
Full ReferenceHumble, P (1968) Computed Electron Micrographs for Tilted Foils Containing Dislocations and Stacking Faults. Australian Journal of Physics, 21 (3). 325pp. doi:10.1071/ph680325
Plain TextHumble, P (1968) Computed Electron Micrographs for Tilted Foils Containing Dislocations and Stacking Faults. Australian Journal of Physics, 21 (3). 325pp. doi:10.1071/ph680325
In(1968) Australian Journal of Physics Vol. 21 (3) CSIRO Publishing

See Also

These are possibly similar items as determined by title/reference text matching only.

Clarebrough, LM, Morton, AJ (1969) Diffraction Contrast from Dissociated Frank Dislocations. I. Computed Electron Micrographs. Australian Journal of Physics, 22 (3). 351pp. doi:10.1071/ph690351
Clarebrough, LM, Morton, AJ (1969) Diffraction Contrast from Dissociated Frank Dislocations. II. Comparison of Experimental and Computed Electron Micrographs. Australian Journal of Physics, 22 (3). 371pp. doi:10.1071/ph690371
Humble, P, Forwood, CT (1968) The Determination of Stacking Fault Energy by the Tetrahedron Method. Australian Journal of Physics, 21 (6). 941pp. doi:10.1071/ph680941
Humble, P (1969) Computed Electron Microscope Images of Lines of Dilation. Australian Journal of Physics, 22 (1). 51pp. doi:10.1071/ph690051
Humble, P. (1968) Electron Diffraction Contrast from Three Parallel Overlapping Stacking Faults. physica status solidi (b), 30 (1). 183-192 doi:10.1002/pssb.19680300122
Head, AK (1969) The Reconstruction of Displacement Fields of Defects in Crystals from Electron Micrographs. Australian Journal of Physics, 22 (3). 345pp. doi:10.1071/ph690345
(1968) Australian Journal of Physics, Table of Contents, Volume 21, 1968. Australian Journal of Physics, 21 (1). 1pp. doi:10.1071/ph68fm
Steeds, J. W. (1974) Computed electron micrographs and defect identificationby A. K. Head, P. Humble, L. M. Clarebrough, A. J. Morton and C. T. Forwood. Acta Crystallographica Section A, 30 (4) 605 doi:10.1107/s056773947400146x
Donolato, C., Klann, H. (1980) Computer simulation of SEM electron beam induced current images of dislocations and stacking faults. Journal of Applied Physics, 51 (3). 1624-1633 doi:10.1063/1.327767
Whelan, M. J., Hirsch, P. B. (1957) Electron diffraction from crystals containing stacking faults: I. Philosophical Magazine, 2 (21). 1121-1142 doi:10.1080/14786435708242742
El-Dhaher, A H G, Farhat, A A, Botros, K Z, Abu-Rezeq, A N (1988) A microcomputer-based image processing system for studies of transmission electron micrographs of stacking faults. Journal of Physics E: Scientific Instruments, 21 (11). 1051-1055 doi:10.1088/0022-3735/21/11/009
 
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