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Weirich, Th. E. (2003) Electron diffraction structure analysis: structural research with low-quality diffraction data. Zeitschrift für Kristallographie - Crystalline Materials, 218 (4) doi:10.1524/zkri.218.4.269.20744

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Reference TypeJournal (article/letter/editorial)
TitleElectron diffraction structure analysis: structural research with low-quality diffraction data
JournalZeitschrift für Kristallographie - Crystalline Materials
AuthorsWeirich, Th. E.Author
Year2003 (January 1)Volume218
Issue4
PublisherWalter de Gruyter GmbH
DOIdoi:10.1524/zkri.218.4.269.20744Search in ResearchGate
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Mindat Ref. ID116349Long-form Identifiermindat:1:5:116349:4
GUID0
Full ReferenceWeirich, Th. E. (2003) Electron diffraction structure analysis: structural research with low-quality diffraction data. Zeitschrift für Kristallographie - Crystalline Materials, 218 (4) doi:10.1524/zkri.218.4.269.20744
Plain TextWeirich, Th. E. (2003) Electron diffraction structure analysis: structural research with low-quality diffraction data. Zeitschrift für Kristallographie - Crystalline Materials, 218 (4) doi:10.1524/zkri.218.4.269.20744
In(2003, January) Zeitschrift für Kristallographie - Crystalline Materials Vol. 218 (4) Walter de Gruyter GmbH
Abstract/NotesAbstractElectron Diffraction Structure Analysis (EDSA) with data from standard selected-area electron diffraction (SAED) is still the method of choice for structure determination of nano-sized single crystals. The recently determined heavy atom structure


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