| Reference Type | Journal (article/letter/editorial) |
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| Title | Quantum size and surface effects in the electrical resistivity and high-energy electron reflectivity of ultrathin lead films |
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| Journal | Physical Review B |
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| Authors | Jal/ochowski, M. | Author |
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| Bauer, E. | Author |
| Year | 1988 (September 15) | Volume | 38 |
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| Issue | 8 |
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| Publisher | American Physical Society (APS) |
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| DOI | doi:10.1103/physrevb.38.5272Search in ResearchGate |
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| Generate Citation Formats |
| Mindat Ref. ID | 14101011 | Long-form Identifier | mindat:1:5:14101011:5 |
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| GUID | 0 |
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| Full Reference | Jal/ochowski, M., Bauer, E. (1988) Quantum size and surface effects in the electrical resistivity and high-energy electron reflectivity of ultrathin lead films. Physical Review B, 38 (8) 5272-5280 doi:10.1103/physrevb.38.5272 |
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| Plain Text | Jal/ochowski, M., Bauer, E. (1988) Quantum size and surface effects in the electrical resistivity and high-energy electron reflectivity of ultrathin lead films. Physical Review B, 38 (8) 5272-5280 doi:10.1103/physrevb.38.5272 |
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| In | (1988, September) Physical Review B Vol. 38 (8) American Physical Society (APS) |
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