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Nithianandam, V. Jeyasingh, Schnatterly, S. E. (1988) Soft-x-ray emission and inelastic electron-scattering study of the electronic excitations in amorphous and crystalline silicon dioxide. Physical Review B, 38 (8) 5547-5553 doi:10.1103/physrevb.38.5547

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Reference TypeJournal (article/letter/editorial)
TitleSoft-x-ray emission and inelastic electron-scattering study of the electronic excitations in amorphous and crystalline silicon dioxide
JournalPhysical Review B
AuthorsNithianandam, V. JeyasinghAuthor
Schnatterly, S. E.Author
Year1988 (September 15)Volume38
Issue8
PublisherAmerican Physical Society (APS)
DOIdoi:10.1103/physrevb.38.5547Search in ResearchGate
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Mindat Ref. ID14101044Long-form Identifiermindat:1:5:14101044:3
GUID0
Full ReferenceNithianandam, V. Jeyasingh, Schnatterly, S. E. (1988) Soft-x-ray emission and inelastic electron-scattering study of the electronic excitations in amorphous and crystalline silicon dioxide. Physical Review B, 38 (8) 5547-5553 doi:10.1103/physrevb.38.5547
Plain TextNithianandam, V. Jeyasingh, Schnatterly, S. E. (1988) Soft-x-ray emission and inelastic electron-scattering study of the electronic excitations in amorphous and crystalline silicon dioxide. Physical Review B, 38 (8) 5547-5553 doi:10.1103/physrevb.38.5547
In(1988, September) Physical Review B Vol. 38 (8) American Physical Society (APS)

See Also

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Nithianandam, V. Jeyasingh, Schnatterly, S. E. (1987) Soft-x-ray emission spectroscopy study of the electronic structure of nonstoichiometric silicon nitride. Physical Review B, 36 (2) 1159-1167 doi:10.1103/physrevb.36.1159
Livins, Peteris, Aton, T., Schnatterly, S. E. (1988) Inelastic electron scattering in amorphous silicon nitride and aluminum oxide with multiple-scattering corrections. Physical Review B, 38 (8) 5511-5519 doi:10.1103/physrevb.38.5511
Nithianandam, Jeyasingh, Schnatterly, Stephen E. (1990) Valence x-ray-emission bands ofa-Si:H/a-SiNx:H superlattices. Physical Review B, 42 (14) 9063-9066 doi:10.1103/physrevb.42.9063
Tarrio, C., Schnatterly, S. E. (1988) Inelastic electron scattering in the high-TccompoundYBa2Cu3O7−x. Physical Review B, 38 (1) 921-924 doi:10.1103/physrevb.38.921
Nithianandam, Jeyasingh, Schnatterly, Stephen E. (1989) Effects of disorder on electronic structures ofa-Si:H anda-SiO2. Physical Review B, 40 (17) 11786-11791 doi:10.1103/physrevb.40.11786
Nithianandam, Jeyasingh, Schnatterly, Stephen E. (1990) Al 2pcore exciton inAlxGa1−xAs. Physical Review B, 42 (5) 3038-3043 doi:10.1103/physrevb.42.3038
Livins, Peteris, Schnatterly, S. E. (1988) Shakeup in soft-x-ray emission. II. Plasmon satellites and x-ray photoemission spectroscopy. Physical Review B, 37 (12) 6742-6749 doi:10.1103/physrevb.37.6742
Velasquez, Steven, Schnatterly, S. E. (1988) L2,3M1satellites in soft x-ray emission. Physical Review A, 38 (12). 6204-6209 doi:10.1103/physreva.38.6204
Carson, R. D., Schnatterly, S. E. (1986) Valence-band electronic structure of silicon nitride studied with the use of soft-x-ray emission. Physical Review B, 33 (4) 2432-2438 doi:10.1103/physrevb.33.2432
Livins, Peteris, Schnatterly, S. E. (1988) Shakeup in soft-x-ray emission. I. The low-energy tail. Physical Review B, 37 (12) 6731-6741 doi:10.1103/physrevb.37.6731
Gu, Guojiang, Schnatterly, S. E. (1995) Electronic structure of intercalated graphite studied by soft-x-ray-emission spectroscopy. Physical Review B, 52 (7) 5298-5301 doi:10.1103/physrevb.52.5298
 
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