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Tyliszczak, T., Hitchcock, A. P., De Crescenzi, M. (1988) Origin and structural sensitivity of surface Auger extended fine structure. Physical Review B, 38 (8) 5768-5771 doi:10.1103/physrevb.38.5768

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Reference TypeJournal (article/letter/editorial)
TitleOrigin and structural sensitivity of surface Auger extended fine structure
JournalPhysical Review B
AuthorsTyliszczak, T.Author
Hitchcock, A. P.Author
De Crescenzi, M.Author
Year1988 (September 15)Volume38
Issue8
PublisherAmerican Physical Society (APS)
DOIdoi:10.1103/physrevb.38.5768Search in ResearchGate
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Mindat Ref. ID14101082Long-form Identifiermindat:1:5:14101082:5
GUID0
Full ReferenceTyliszczak, T., Hitchcock, A. P., De Crescenzi, M. (1988) Origin and structural sensitivity of surface Auger extended fine structure. Physical Review B, 38 (8) 5768-5771 doi:10.1103/physrevb.38.5768
Plain TextTyliszczak, T., Hitchcock, A. P., De Crescenzi, M. (1988) Origin and structural sensitivity of surface Auger extended fine structure. Physical Review B, 38 (8) 5768-5771 doi:10.1103/physrevb.38.5768
In(1988, September) Physical Review B Vol. 38 (8) American Physical Society (APS)

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De Crescenzi, M., Hitchcock, A. P., Tyliszczak, T. (1989) Extended fine Auger structure spectroscopy of Ag and Cu. Physical Review B, 39 (14) 9839-9851 doi:10.1103/physrevb.39.9839
Tyliszczak, T., De Crescenzi, M., Hitchcock, A. P. (1988) Cu/Ag(111) interface studied by surface electron energy-loss fine-structure spectroscopy. Physical Review B, 37 (18) 10664-10673 doi:10.1103/physrevb.37.10664
De Crescenzi, M., Tyliszczak, T., Hitchcock, A.P. (1989) Extended fine structures in auger spectra (EXFAS): Temperature and core hole dependence of Cu and Ag(111). Physica B: Condensed Matter, 158 (1). 557-559 doi:10.1016/0921-4526(89)90386-4
Lu, Z. H., Tyliszczak, T., Hitchcock, A. P. (1998) Structure of the Cl-passivated GaAs(111) surface. Physical Review B, 58 (20) 13820-13823 doi:10.1103/physrevb.58.13820
Aebi, P., Tyliszczak, T., Hitchcock, A. P., Baines, K. M., Sham, T. K., Jackman, T. E., Baribeau, J-M., Lockwood, D. J. (1992) Simultaneous analysis of multiple extended x-ray-absorption fine-structure spectra: Application to studies of buried Ge-Si interfaces. Physical Review B, 45 (23) 13579-13590 doi:10.1103/physrevb.45.13579
Rosei, R., De Crescenzi, M., Sette, F., Quaresima, C., Savoia, A., Perfetti, P. (1983) Structure of graphitic carbon on Ni(111): A surface extended-energy-loss fine-structure study. Physical Review B, 28 (2) 1161-1164 doi:10.1103/physrevb.28.1161
De Crescenzi, M., Diociaiuti, M., Picozzi, P., Santucci, S. (1986) Electronic and structural investigations of palladium clusters by x-ray absorption near-edge structure and extended x-ray absorption fine-structure spectroscopies. Physical Review B, 34 (6) 4334-4337 doi:10.1103/physrevb.34.4334
De Crescenzi, M., Lozzi, L., Picozzi, P., Santucci, S., Benfatto, M., Natoli, C. R. (1989) Structural determination of crystalline silicon by extended energy-loss fine-structure spectroscopy. Physical Review B, 39 (12) 8409-8422 doi:10.1103/physrevb.39.8409
Veuillen, J. Y., Bensaoula, A., De Crescenzi, M., Derrien, J. (1989) Short-range local order of the Co/Si(111) interface studied by the extended Auger fine-structure technique. Physical Review B, 39 (14) 10398-10401 doi:10.1103/physrevb.39.10398
De Crescenzi, M., Chiarello, G., Colavita, E., Memeo, R. (1984) Extended fine structures above TiL2,3edge: A comparison between reflection energy loss and extended x-ray-absorption fine-structure results. Physical Review B, 29 (6) 3730-3732 doi:10.1103/physrevb.29.3730
Motta, N., De Crescenzi, M., Balzarotti, A. (1983) Structural and electronic properties of Fe and TiFe from extended and near-edge x-ray-absorption structure. Physical Review B, 27 (8) 4712-4721 doi:10.1103/physrevb.27.4712
 
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