| Reference Type | Journal (article/letter/editorial) |
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| Title | Oxidation of Si(111)-(7×7) as studied by scanning tunneling microscopy |
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| Journal | Physical Review B |
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| Authors | Leibsle, F. M. | Author |
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| Samsavar, A. | Author |
| Chiang, T. -C. | Author |
| Year | 1988 (September 15) | Volume | 38 |
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| Issue | 8 |
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| Publisher | American Physical Society (APS) |
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| DOI | doi:10.1103/physrevb.38.5780Search in ResearchGate |
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| Generate Citation Formats |
| Mindat Ref. ID | 14101085 | Long-form Identifier | mindat:1:5:14101085:6 |
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| GUID | 0 |
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| Full Reference | Leibsle, F. M., Samsavar, A., Chiang, T. -C. (1988) Oxidation of Si(111)-(7×7) as studied by scanning tunneling microscopy. Physical Review B, 38 (8) 5780-5783 doi:10.1103/physrevb.38.5780 |
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| Plain Text | Leibsle, F. M., Samsavar, A., Chiang, T. -C. (1988) Oxidation of Si(111)-(7×7) as studied by scanning tunneling microscopy. Physical Review B, 38 (8) 5780-5783 doi:10.1103/physrevb.38.5780 |
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| In | (1988, September) Physical Review B Vol. 38 (8) American Physical Society (APS) |
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