| Reference Type | Journal (article/letter/editorial) |
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| Title | X-ray diffraction study of epitaxial Nb-Ta overlayers on sapphire |
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| Journal | Physical Review B |
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| Authors | Lamelas, F. J. | Author |
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| He, Hui | Author |
| Clarke, Roy | Author |
| Year | 1988 (September 15) | Volume | 38 |
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| Issue | 9 |
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| Publisher | American Physical Society (APS) |
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| DOI | doi:10.1103/physrevb.38.6334Search in ResearchGate |
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| Generate Citation Formats |
| Mindat Ref. ID | 14101158 | Long-form Identifier | mindat:1:5:14101158:7 |
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| GUID | 0 |
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| Full Reference | Lamelas, F. J., He, Hui, Clarke, Roy (1988) X-ray diffraction study of epitaxial Nb-Ta overlayers on sapphire. Physical Review B, 38 (9) 6334-6337 doi:10.1103/physrevb.38.6334 |
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| Plain Text | Lamelas, F. J., He, Hui, Clarke, Roy (1988) X-ray diffraction study of epitaxial Nb-Ta overlayers on sapphire. Physical Review B, 38 (9) 6334-6337 doi:10.1103/physrevb.38.6334 |
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| In | (1988, September) Physical Review B Vol. 38 (9) American Physical Society (APS) |
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