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Veuillen, J. Y., Nguyn, T. T. A., Cinti, R., De Crescenzi, M., Derrien, J. (1989) Co/Si(111) interface investigated by bremsstrahlung isochromat spectroscopy and x-ray-induced photoemission spectroscopy. Physical Review B, 39 (11) 8015-8017 doi:10.1103/physrevb.39.8015

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Reference TypeJournal (article/letter/editorial)
TitleCo/Si(111) interface investigated by bremsstrahlung isochromat spectroscopy and x-ray-induced photoemission spectroscopy
JournalPhysical Review B
AuthorsVeuillen, J. Y.Author
Nguyn, T. T. A.Author
Cinti, R.Author
De Crescenzi, M.Author
Derrien, J.Author
Year1989 (April 15)Volume39
Issue11
PublisherAmerican Physical Society (APS)
DOIdoi:10.1103/physrevb.39.8015Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID14101557Long-form Identifiermindat:1:5:14101557:8
GUID0
Full ReferenceVeuillen, J. Y., Nguyn, T. T. A., Cinti, R., De Crescenzi, M., Derrien, J. (1989) Co/Si(111) interface investigated by bremsstrahlung isochromat spectroscopy and x-ray-induced photoemission spectroscopy. Physical Review B, 39 (11) 8015-8017 doi:10.1103/physrevb.39.8015
Plain TextVeuillen, J. Y., Nguyn, T. T. A., Cinti, R., De Crescenzi, M., Derrien, J. (1989) Co/Si(111) interface investigated by bremsstrahlung isochromat spectroscopy and x-ray-induced photoemission spectroscopy. Physical Review B, 39 (11) 8015-8017 doi:10.1103/physrevb.39.8015
In(1989, April) Physical Review B Vol. 39 (11) American Physical Society (APS)

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De Crescenzi, M., Gaggiotti, G., Motta, N., Patella, F., Balzarotti, A., Derrien, J. (1990) Bremsstrahlung-isochromat-spectroscopy and x-ray-photoelectron-spectroscopy investigation of the electronic structure of β-FeSi2and the Fe/Si(111) interface. Physical Review B, 42 (9) 5871-5874 doi:10.1103/physrevb.42.5871
Veuillen, J. Y., Bensaoula, A., De Crescenzi, M., Derrien, J. (1989) Short-range local order of the Co/Si(111) interface studied by the extended Auger fine-structure technique. Physical Review B, 39 (14) 10398-10401 doi:10.1103/physrevb.39.10398
De Crescenzi, M., Derrien, J., Chainet, E., Orumchian, K. (1989) Core-level electron-energy-loss spectroscopy as a local probe for the electronic structure of the Co/Si(111) interface. Physical Review B, 39 (8) 5520-5523 doi:10.1103/physrevb.39.5520
Sarma, D. D., Krummacher, S., Wallash, A., Crow, J. E. (1986) X-ray-photoemission-spectroscopy and bremsstrahlung-isochromat-spectroscopy study of the (Y,U)B4system. Physical Review B, 34 (6) 3737-3740 doi:10.1103/physrevb.34.3737
Bensaoula, A, Veuillen, J.Y, Tan, T.A.Nguyen, Derrien, J, De Crescenzi, M (1991) Study of the Co/Si(111) interface formation using electron energy loss spectroscopy. Surface Science, 241 (3). 425-430 doi:10.1016/0039-6028(91)90102-x
Bensaoula, A., Veuillen, J.Y., Tan, T.A.Nguyen, Derrien, J., De Crescenzi, M. (1991) Study of the Co/Si(111) interface formation using electron energy loss spectroscopy. Surface Science Letters, 241 (3). doi:10.1016/0167-2584(91)91142-j
Gunnella, R., Veuillen, J. Y., Tan, T. A. Nguyen, Flank, A. M. (1998) X-ray absorption spectroscopy study of atomic structure of epitaxialErSi1.7(0001)on Si(111) Physical Review B, 57 (7) 4154-4159 doi:10.1103/physrevb.57.4154
Derrien, J., De Crescenzi, M., Chainet, E., d’Anterroches, C., Pirri, C., Gewinner, G., Peruchetti, J. C. (1987) Co/Si(111) interface formation at room temperature. Physical Review B, 36 (12) 6681-6684 doi:10.1103/physrevb.36.6681
van der Marel, D., van Elp, J., Sawatzky, G. A., Heitmann, D. (1988) X-ray photoemission, bremsstrahlung isochromat, Auger-electron, and optical spectroscopy studies of Y-Ba-Cu-O thin films. Physical Review B, 37 (10) 5136-5141 doi:10.1103/physrevb.37.5136
Kuiper, P., van Elp, J., Sawatzky, G. A., Fujimori, A., Hosoya, S., de Leeuw, D. M. (1991) Unoccupied density of states ofLa2−xSrxNiO4+δstudied by polarization-dependent x-ray-absorption spectroscopy and bremsstrahlung isochromat spectroscopy. Physical Review B, 44 (9) 4570-4575 doi:10.1103/physrevb.44.4570
Tyliszczak, T., De Crescenzi, M., Hitchcock, A. P. (1988) Cu/Ag(111) interface studied by surface electron energy-loss fine-structure spectroscopy. Physical Review B, 37 (18) 10664-10673 doi:10.1103/physrevb.37.10664
 
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