Hölscher, H., Gotsmann, B., Allers, W., Schwarz, U., Fuchs, H., Wiesendanger, R. (2001) Measurement of conservative and dissipative tip-sample interaction forces with a dynamic force microscope using the frequency modulation technique. Physical Review B, 64 (7) doi:10.1103/physrevb.64.075402

References Listed

These are the references the publisher has listed as being connected to the article. Please check the article itself for the full list of references which may differ. Not all references are currently linkable within the Digital Library.

	Binnig, G., Quate, C. F., Gerber, Ch. (1986) Atomic Force Microscope. Physical Review Letters, 56 (9). 930-933 doi:10.1103/physrevlett.56.930
	Giessibl, F. J. (1995) Atomic Resolution of the Silicon (111)-(7x7) Surface by Atomic Force Microscopy. Science, 267 (5194). 68-71 doi:10.1126/science.267.5194.68
	Sugawara, Y., Ohta, M., Ueyama, H., Morita, S. (1995) Defect Motion on an InP(110) Surface Observed with Noncontact Atomic Force Microscopy. Science, 270 (5242). 1646-1648 doi:10.1126/science.270.5242.1646
	Anczykowski, B., Krüger, D., Fuchs, H. (1996) Cantilever dynamics in quasinoncontact force microscopy: Spectroscopic aspects. Physical Review B, 53 (23) 15485-15488 doi:10.1103/physrevb.53.15485
	(1997) J. Appl. Phys. 81, 6592
	(1997) Ann. Phys. (Leipzig) 6, 34
	Sasaki, Naruo, Tsukada, Masaru (1998) The Relation between Resonance Curves and Tip-Surface Interaction Potential in Noncontact Atomic-Force Microscopy. Japanese Journal of Applied Physics, 37. doi:10.1143/jjap.37.l533
	(1998) Appl. Phys. A: Mater. Sci. Process. A66, S287
	(1998) Appl. Phys. A: Mater. Sci. Process. A66, S219
	(1998) Probe Microsc. 1, 215
	Boisgard, R, Michel, D, Aimé, J.P (1998) Hysteresis generated by attractive interaction: oscillating behavior of a vibrating tip–microlever system near a surface. Surface Science, 401 (2). 199-205 doi:10.1016/s0039-6028(97)01079-0
	(1998) Phys. Rev. Lett. 82, 3388
	Albrecht, T. R., Grütter, P., Horne, D., Rugar, D. (1991) Frequency modulation detection using high‐Qcantilevers for enhanced force microscope sensitivity. Journal of Applied Physics, 69 (2). 668-673 doi:10.1063/1.347347
	Gotsmann, B, Krüger, D, Fuchs, H (1997) Tip-sample interactions in scanning force microscopy using the frequency-modulation technique: Experiments and computer simulation. Europhysics Letters (EPL), 39. 153-158 doi:10.1209/epl/i1997-00542-5
	(1998) Europhys. Lett. 41, 581
	Gotsmann, B., Anczykowski, B., Seidel, C., Fuchs, H. (1999) Determination of tip–sample interaction forces from measured dynamic force spectroscopy curves. Applied Surface Science, 140. 314-319 doi:10.1016/s0169-4332(98)00547-9
	Gotsmann, B., Seidel, C., Anczykowski, B., Fuchs, H. (1999) Conservative and dissipative tip-sample interaction forces probed with dynamic AFM. Physical Review B, 60 (15) 11051-11061 doi:10.1103/physrevb.60.11051
	Martin, Y., Williams, C. C., Wickramasinghe, H. K. (1987) Atomic force microscope–force mapping and profiling on a sub 100‐Å scale. Journal of Applied Physics, 61 (10). 4723-4729 doi:10.1063/1.338807
	Not Yet Imported: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films - journal-article : 10.1116/1.575440 If you would like this item imported into the Digital Library, please contact us quoting Journal ID
	(1998) Appl. Phys. A: Mater. Sci. Process. A66, S295
	Livshits, Alexander I., Shluger, Alexander L., Rohl, Andrew L. (1999) Contrast mechanism in non-contact SFM imaging of ionic surfaces. Applied Surface Science, 140. 327-332 doi:10.1016/s0169-4332(98)00549-2
	Giessibl, Franz J. (1997) Forces and frequency shifts in atomic-resolution dynamic-force microscopy. Physical Review B, 56 (24) 16010-16015 doi:10.1103/physrevb.56.16010
	Dürig, U. (1999) Relations between interaction force and frequency shift in large-amplitude dynamic force microscopy. Applied Physics Letters, 75 (3). 433-435 doi:10.1063/1.124399
	Pérez, Rubén, Štich, Ivan, Payne, Michael C., Terakura, Kiyoyuki (1998) Surface-tip interactions in noncontact atomic-force microscopy on reactive surfaces: Si(111) Physical Review B, 58 (16) 10835-10849 doi:10.1103/physrevb.58.10835
	Gauthier, Michel, Tsukada, Masaru (1999) Theory of noncontact dissipation force microscopy. Physical Review B, 60 (16) 11716-11722 doi:10.1103/physrevb.60.11716
	(2000) New J. Phys. 2, 5.1

See Also

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	Hölscher, H., Gotsmann, B., Allers, W., Schwarz, U. D., Fuchs, H., Wiesendanger, R. (2001) Comment on “Damping Mechanism in Dynamic Force Microscopy”. Physical Review Letters, 88 (1). doi:10.1103/physrevlett.88.019601
	Gotsmann, B., Seidel, C., Anczykowski, B., Fuchs, H. (1999) Conservative and dissipative tip-sample interaction forces probed with dynamic AFM. Physical Review B, 60 (15) 11051-11061 doi:10.1103/physrevb.60.11051
	Hölscher, H., Allers, W., Schwarz, U. D., Schwarz, A., Wiesendanger, R. (1999) Determination of Tip-Sample Interaction Potentials by Dynamic Force Spectroscopy. Physical Review Letters, 83 (23). 4780-4783 doi:10.1103/physrevlett.83.4780
	Gotsmann, B., Fuchs, H. (2001) Dynamic Force Spectroscopy of Conservative and Dissipative Forces in an Al-Au(111) Tip-Sample System. Physical Review Letters, 86 (12). 2597-2600 doi:10.1103/physrevlett.86.2597
	Hölscher, H., Gotsmann, B., Schirmeisen, A. (2003) Dynamic force spectroscopy using the frequency modulation technique with constant excitation. Physical Review B, 68 (15) doi:10.1103/physrevb.68.153401
	Hölscher, H., Schwarz, A., Allers, W., Schwarz, U. D., Wiesendanger, R. (2000) Quantitative analysis of dynamic-force-spectroscopy data on graphite(0001) in the contact and noncontact regimes. Physical Review B, 61 (19) 12678-12681 doi:10.1103/physrevb.61.12678
	Hölscher, H., Allers, W., Schwarz, U. D., Schwarz, A., Wiesendanger, R. (2000) Interpretation of “true atomic resolution” images of graphite (0001) in noncontact atomic force microscopy. Physical Review B, 62 (11) 6967-6970 doi:10.1103/physrevb.62.6967
	Gotsmann, B, Krüger, D, Fuchs, H (1998) Tip-sample interactions in scanning force microscopy using the frequency-modulation technique: Experiments and computer simulation. Europhysics Letters (EPL), 41. 583 doi:10.1209/epl/i1998-00195-4
	Hölscher, H., Raberg, W., Schwarz, U. D., Hasbach, A., Wandelt, K., Wiesendanger, R. (1999) Imaging of sub-unit-cell structures in the contact mode of the scanning force microscope. Physical Review B, 59 (3) 1661-1664 doi:10.1103/physrevb.59.1661
	Gotsmann, B, Krüger, D, Fuchs, H (1997) Tip-sample interactions in scanning force microscopy using the frequency-modulation technique: Experiments and computer simulation. Europhysics Letters (EPL), 39. 153-158 doi:10.1209/epl/i1997-00542-5
	Schwarz, A., Allers, W., Schwarz, U. D., Wiesendanger, R. (2000) Dynamic-mode scanning force microscopy study ofn-InAs(110)-(1×1)at low temperatures. Physical Review B, 61 (4) 2837-2845 doi:10.1103/physrevb.61.2837