| Reference Type | Journal (article/letter/editorial) |
|---|
| Title | Electron density distribution and bond critical point properties for forsterite, Mg2SiO4, determined with synchrotron single crystal X-ray diffraction data |
|---|
| Journal | Physics and Chemistry of Minerals |
|---|
| Authors | Kirfel, A. | Author |
|---|
| Lippmann, T. | Author |
| Blaha, P. | Author |
| Schwarz, K. | Author |
| Cox, D. F. | Author |
| Rosso, K. M. | Author |
| Gibbs, G. V. | Author |
| Year | 2005 (May 12) | Volume | 32 |
|---|
| Page(s) | 301-313 | Issue | 4 |
|---|
| Publisher | Springer Science and Business Media LLC |
|---|
| URL | |
|---|
| DOI | doi:10.1007/s00269-005-0468-5Search in ResearchGate |
|---|
| Generate Citation Formats |
| Classification | Not set | LoC | Not set |
|---|
| Mindat Ref. ID | 153174 | Long-form Identifier | mindat:1:5:153174:3 |
|---|
|
| GUID | 0 |
|---|
| Full Reference | Kirfel, A.; Lippmann, T.; Blaha, P.; Schwarz, K.; Cox, D. F.; Rosso, K. M.; Gibbs, G. V. (2005) Electron density distribution and bond critical point properties for forsterite, Mg2SiO4, determined with synchrotron single crystal X-ray diffraction data. Physics and Chemistry of Minerals, 32 (4). 301-313 doi:10.1007/s00269-005-0468-5 |
|---|
| Plain Text | Kirfel, A.; Lippmann, T.; Blaha, P.; Schwarz, K.; Cox, D. F.; Rosso, K. M.; Gibbs, G. V. (2005) Electron density distribution and bond critical point properties for forsterite, Mg2SiO4, determined with synchrotron single crystal X-ray diffraction data. Physics and Chemistry of Minerals, 32 (4). 301-313 doi:10.1007/s00269-005-0468-5 |
|---|
| In | (2005, July) Physics and Chemistry of Minerals Vol. 32 (4) Springer Science and Business Media LLC |
|---|
These are possibly similar items as determined by title/reference text matching only.