Reference Type | - plain text - |
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Year | 1994 |
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Original Entry | Li, D., Bancroft, G.M., Kasrai, M., Fleet, M.E., Secco, R.A., Feng, X.H., Tan, K.H., Yang, B.X. (1994) X-ray absorption spectroscopy of silicon dioxide (SiO2) polymorphs: the structural characterization of opal. American Mineralogist: 79: 622-632. |
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Mindat Ref. ID | 16119008 | Long-form Identifier | mindat:1:5:16119008:8 |
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GUID | 41c7decf-b8b2-4a7b-b017-4df83e4b898f |
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Full Reference | Li, D., Bancroft, G.M., Kasrai, M., Fleet, M.E., Secco, R.A., Feng, X.H., Tan, K.H., Yang, B.X. (1994) X-ray absorption spectroscopy of silicon dioxide (SiO2) polymorphs: the structural characterization of opal. American Mineralogist: 79: 622-632. |
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Plain Text | Li, D., Bancroft, G.M., Kasrai, M., Fleet, M.E., Secco, R.A., Feng, X.H., Tan, K.H., Yang, B.X. (1994) X-ray absorption spectroscopy of silicon dioxide (SiO2) polymorphs: the structural characterization of opal. American Mineralogist: 79: 622-632. |
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