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Nowakowski, Pawel, Bonifacio, Cecile, Ray, Mary, Fischione, Paul (2023) Developments in Broad Ion Beam Milling Sample Preparation Instrumentation for Microscopy and Microanalysis Applications. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 2075-2076 doi:10.1093/micmic/ozad067.1074

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Reference TypeJournal (article/letter/editorial)
TitleDevelopments in Broad Ion Beam Milling Sample Preparation Instrumentation for Microscopy and Microanalysis Applications
JournalMicroscopy and Microanalysis
AuthorsNowakowski, PawelAuthor
Bonifacio, CecileAuthor
Ray, MaryAuthor
Fischione, PaulAuthor
Year2023 (July 22)Volume29
PublisherOxford University Press (OUP)
DOIdoi:10.1093/micmic/ozad067.1074Search in ResearchGate
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Mindat Ref. ID16637518Long-form Identifiermindat:1:5:16637518:3
GUID0
Full ReferenceNowakowski, Pawel, Bonifacio, Cecile, Ray, Mary, Fischione, Paul (2023) Developments in Broad Ion Beam Milling Sample Preparation Instrumentation for Microscopy and Microanalysis Applications. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 2075-2076 doi:10.1093/micmic/ozad067.1074
Plain TextNowakowski, Pawel, Bonifacio, Cecile, Ray, Mary, Fischione, Paul (2023) Developments in Broad Ion Beam Milling Sample Preparation Instrumentation for Microscopy and Microanalysis Applications. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 2075-2076 doi:10.1093/micmic/ozad067.1074
In(2023) Microscopy and Microanalysis Vol. 29. Cambridge University Press (CUP)

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Nowakowski, Pawel, Bonifacio, Cecile, Ray, Mary, Fischione, Paul (2023) Improved Sample Preparation Technique for Transmission Kikuchi Diffraction (TKD) Analyses Allows Large Area Data Acquisition. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 134-135 doi:10.1093/micmic/ozad067.060
Nowakowski, Pawel, Bonifacio, Cecile, Ray, Mary, Fischione, Paul (2022) Advances in Beam-sensitive Sample Preparation and Observation. Microscopy and Microanalysis, 28. 2214-2215 doi:10.1017/s1431927622008546
Nowakowski, Pawel, Ray, Mary, Fischione, Paul (2024) Determining the Best Ar Ion Milling Sample Preparation Conditions for SEM Applications. Microscopy and Microanalysis, 30. doi:10.1093/mam/ozae044.1090
Nowakowski, Pawel, Ray, Mary, Fischione, Paul (2020) Advances in Large-area Sample Preparation Using Broad Argon Ion Beam Milling for Multiphase Materials. Microscopy and Microanalysis, 26. 1982-1984 doi:10.1017/s1431927620020024
Nowakowski, Pawel, Bonifacio, Cecile, Ray, Mary, Fischione, Paul (2021) Developments in controlled environmental transfer for Li-based battery materials: From sample preparation to SEM investigation. Microscopy and Microanalysis, 27. 1844-1845 doi:10.1017/s1431927621006747
Nowakowski, Pawel, Schlenker, James, Ray, Mary, Fischione, Paul (2016) Sample Preparation Using Broad Argon Ion Beam Milling for Electron Backscatter Diffraction (EBSD) Analysis. Microscopy and Microanalysis, 22. 12-13 doi:10.1017/s143192761600091x
Bonifacio, Cecile, Nowakowski, Pawel, Ray, Mary, Fischione, Paul (2020) Multi-length Scale Cryogenic Sample Preparation to Electron Microscopy of Battery Materials. Microscopy and Microanalysis, 26. 3022-3024 doi:10.1017/s1431927620023569
Bonifacio, Cecile, Downing, Clive, Nowakowski, Pawel, Li, Richard, Ray, Mary, Fischione, Paul (2021) Developments in sample preparation of advanced semiconductor devices from the bulk to nanometer-length scales. Microscopy and Microanalysis, 27. 1078-1080 doi:10.1017/s1431927621004062
Bonifacio, Cecile, Nowakowski, Pawel, Ray, Mary, Fischione, Paul (2021) Alternative Post-FIB Polishing Using Low-Energy Argon Ion Milling to Prevent Grid Redeposition. Microscopy and Microanalysis, 27. 426-429 doi:10.1017/s1431927621002038
Nowakowski, Pawel, Bonifacio, Cecile, Ray, Mary, Fischione, Paul (2019) Combining Emerging Sample Preparation Methods, SEM, and TEM Investigations for Microelectronics Device Characterization at Multiple Scales. Microscopy and Microanalysis, 25. 688-689 doi:10.1017/s1431927619004173
Bonifacio, C S, Li, R, Nowakowski, P, Ray, M L, Fischione, P (2023) Artifact-Free Preparation of Plan View TEM Specimens and Its Application to MRAM Devices. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 105-106 doi:10.1093/micmic/ozad067.045
 
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