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Peters, Jonathan J. P., Reed, Bryan W., Jimbo, Yu, Noguchi, Kanako, Müller, Karin H., Porter, Alexandra, Masiel, Daniel J., Jones, Lewys (2024) Event-responsive scanning transmission electron microscopy. Science, 385 (6708) 549-553 doi:10.1126/science.ado8579

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Reference TypeJournal (article/letter/editorial)
TitleEvent-responsive scanning transmission electron microscopy
JournalScience
AuthorsPeters, Jonathan J. P.Author
Reed, Bryan W.Author
Jimbo, YuAuthor
Noguchi, KanakoAuthor
Müller, Karin H.Author
Porter, AlexandraAuthor
Masiel, Daniel J.Author
Jones, LewysAuthor
Year2024 (August 2)Volume385
Page(s)549-553Issue6708
PublisherAmerican Association for the Advancement of Science (AAAS)
DOIdoi:10.1126/science.ado8579Search in ResearchGate
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Mindat Ref. ID17536696Long-form Identifiermindat:1:5:17536696:7
GUID0
Full ReferencePeters, Jonathan J. P., Reed, Bryan W., Jimbo, Yu, Noguchi, Kanako, Müller, Karin H., Porter, Alexandra, Masiel, Daniel J., Jones, Lewys (2024) Event-responsive scanning transmission electron microscopy. Science, 385 (6708) 549-553 doi:10.1126/science.ado8579
Plain TextPeters, Jonathan J. P., Reed, Bryan W., Jimbo, Yu, Noguchi, Kanako, Müller, Karin H., Porter, Alexandra, Masiel, Daniel J., Jones, Lewys (2024) Event-responsive scanning transmission electron microscopy. Science, 385 (6708) 549-553 doi:10.1126/science.ado8579
In(2024, August) Science Vol. 385 (6708) American Association for the Advancement of Science (AAAS)

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Reed, Bryan W; Masiel, Daniel J; Peters, Jonathan J P; Jones, Lewys (2025) Automated Data Analysis for Event-Driven Scanning Transmission Electron Microscopy (Tempo-STEM). Microscopy and Microanalysis, 31. doi:10.1093/mam/ozaf048.858
Mosse, Matthew, Peters, Jonathan J P, Reed, Bryan W, Masiel, Daniel J, Conroy, Michele, Jones, Lewys (2024) Event-Responsive Beam-Modulated STEM with Multi-Frame and Sparse Scanning. Microscopy and Microanalysis, 30. doi:10.1093/mam/ozae044.191
Peters, Jonathan J P, Reed, Bryan W, Jimbo, Yu, Porter, Alexandra, Masiel, Daniel, Jones, Lewys (2023) A New Low-dose STEM Imaging Mode with Probability Driven Intra-pixel Beam Blanking. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 1754-1755 doi:10.1093/micmic/ozad067.907
Peters, Jonathan J. P., Mullarkey, Tiarnan, Hedley, Emma, Müller, Karin H., Porter, Alexandra, Mostaed, Ali, Jones, Lewys (2023) Electron counting detectors in scanning transmission electron microscopy via hardware signal processing. Nature Communications, 14 (1) doi:10.1038/s41467-023-40875-w
Reed, Bryan W., Park, Sang Tae, Masiel, Daniel J. (2016) Quantifying the Advantages of Compressive Sensing and Sparse Reconstruction for Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 22. 286-287 doi:10.1017/s1431927616002282
Reed, Bryan W., Park, Sang Tae, Bloom, Ruth S., Masiel, Daniel J. (2017) Compressively Sensed Video Acquisition in Transmission Electron Microscopy. Microscopy and Microanalysis, 23. 84-85 doi:10.1017/s1431927617001106
Peters, Jonathan J P, Mullarkey, Tiarnan, Gott, James A, Nelson, Elizabeth, Jones, Lewys (2023) Interlacing in Atomic Resolution Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 29 (4) Oxford University Press (OUP) 1373-1379 doi:10.1093/micmic/ozad056
Bekkevold, Julie Marie; Peters, Jonathan J P; Ishikawa, Ryo; Shibata, Naoya; Jones, Lewys (2025) Auto-thresholding for unbiased electron counting. Microscopy, 74 (6). doi:10.1093/jmicro/dfaf025
Hashiguchi, Hiroki, Yagi, Kazuki, Jimbo, Yu, Sagawa, Ryusuke, Bloom, Ruth Shewmon, Reed, Bryan, Park, Sang Tae, Masiel, Daniel J., Ohnishi, Ichiro (2022) Ways to Suppress Electron Beam Damage Using High-Speed Electron Beam Control by Electrostatic Shutter in Sample Observation and Analysis. Microscopy and Microanalysis, 28. 2200-2201 doi:10.1017/s1431927622008492
McBean, Patrick, Peters, Jonathan J P, Dooley, Stephen, Jones, Lewys (2024) The Environmental Impact of Large Scientific Infrastructure. Microscopy and Microanalysis, 30. doi:10.1093/mam/ozae044.961
Reed, Bryan W., Park, Sang Tae, Masiel, Daniel J. (2016) Beyond Movie Mode: Bridging the Gap of Time Resolution. Microscopy and Microanalysis, 22. 706-707 doi:10.1017/s1431927616004384
 
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