| Reference Type | Journal (article/letter/editorial) |
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| Title | Synchrotron X-ray topography of bismuth silicon oxide crystals |
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| Journal | Journal of Crystal Growth |
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| Authors | Martínez-López, J. | Author |
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| González-Mañas, M. | Author |
| Caballero, M.A. | Author |
| Diéguez, E. | Author |
| Capelle, B. | Author |
| Year | 1996 (September) | Volume | 166 |
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| Issue | 1 |
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| Publisher | Elsevier BV |
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| DOI | doi:10.1016/0022-0248(96)00107-8Search in ResearchGate |
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| Generate Citation Formats |
| Mindat Ref. ID | 2829459 | Long-form Identifier | mindat:1:5:2829459:1 |
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| GUID | 0 |
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| Full Reference | Martínez-López, J., González-Mañas, M., Caballero, M.A., Diéguez, E., Capelle, B. (1996) Synchrotron X-ray topography of bismuth silicon oxide crystals. Journal of Crystal Growth, 166 (1). 325-328 doi:10.1016/0022-0248(96)00107-8 |
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| Plain Text | Martínez-López, J., González-Mañas, M., Caballero, M.A., Diéguez, E., Capelle, B. (1996) Synchrotron X-ray topography of bismuth silicon oxide crystals. Journal of Crystal Growth, 166 (1). 325-328 doi:10.1016/0022-0248(96)00107-8 |
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| In | (1996, September) Journal of Crystal Growth Vol. 166 (1) Elsevier BV |
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