| Reference Type | Journal (article/letter/editorial) |
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| Title | Flaw-Tolerance and R-Curve Behavior of Liquid-Phase-Sintered Silicon Carbides with Different Microstructures |
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| Journal | Journal of the American Ceramic Society |
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| Authors | Lee, Seung Kun | Author |
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| Kim, Do Kyung | Author |
| Kim, Chong Hee | Author |
| Year | 1995 (January) | Volume | 78 |
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| Issue | 1 |
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| Publisher | Wiley |
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| DOI | doi:10.1111/j.1151-2916.1995.tb08361.xSearch in ResearchGate |
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| Generate Citation Formats |
| Mindat Ref. ID | 4092012 | Long-form Identifier | mindat:1:5:4092012:0 |
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| GUID | 0 |
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| Full Reference | Lee, Seung Kun, Kim, Do Kyung, Kim, Chong Hee (1995) Flaw-Tolerance and R-Curve Behavior of Liquid-Phase-Sintered Silicon Carbides with Different Microstructures. Journal of the American Ceramic Society, 78 (1). 65-70 doi:10.1111/j.1151-2916.1995.tb08361.x |
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| Plain Text | Lee, Seung Kun, Kim, Do Kyung, Kim, Chong Hee (1995) Flaw-Tolerance and R-Curve Behavior of Liquid-Phase-Sintered Silicon Carbides with Different Microstructures. Journal of the American Ceramic Society, 78 (1). 65-70 doi:10.1111/j.1151-2916.1995.tb08361.x |
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| In | (1995, January) Journal of the American Ceramic Society Vol. 78 (1) Wiley |
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These are possibly similar items as determined by title/reference text matching only.