Engi, Martin (1982) A correction procedure for the effects of inclusions on electron probe microanalyses of fine-grained materials. Computers & Geosciences, 8 (3) 265-284 doi:10.1016/0098-3004(82)90002-4

| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | A correction procedure for the effects of inclusions on electron probe microanalyses of fine-grained materials | ||
| Journal | Computers & Geosciences | ||
| Authors | Engi, Martin | Author | |
| Year | 1982 (January) | Volume | 8 |
| Issue | 3 | ||
| Publisher | Elsevier BV | ||
| DOI | doi:10.1016/0098-3004(82)90002-4Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 445146 | Long-form Identifier | mindat:1:5:445146:8 |
| GUID | 0 | ||
| Full Reference | Engi, Martin (1982) A correction procedure for the effects of inclusions on electron probe microanalyses of fine-grained materials. Computers & Geosciences, 8 (3) 265-284 doi:10.1016/0098-3004(82)90002-4 | ||
| Plain Text | Engi, Martin (1982) A correction procedure for the effects of inclusions on electron probe microanalyses of fine-grained materials. Computers & Geosciences, 8 (3) 265-284 doi:10.1016/0098-3004(82)90002-4 | ||
| In | (1982, January) Computers & Geosciences Vol. 8 (3) Elsevier BV | ||
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