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Viswanathan, A. (1972) On the application of Wilson's variance–range analysis to polymeric X-ray diffraction profiles. Journal of Applied Crystallography, 5 (4) 300 doi:10.1107/s0021889872009550

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Reference TypeJournal (article/letter/editorial)
TitleOn the application of Wilson's variance–range analysis to polymeric X-ray diffraction profiles
JournalJournal of Applied Crystallography
AuthorsViswanathan, A.Author
Year1972 (August 1)Volume5
Issue4
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s0021889872009550Search in ResearchGate
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Mindat Ref. ID463513Long-form Identifiermindat:1:5:463513:4
GUID0
Full ReferenceViswanathan, A. (1972) On the application of Wilson's variance–range analysis to polymeric X-ray diffraction profiles. Journal of Applied Crystallography, 5 (4) 300 doi:10.1107/s0021889872009550
Plain TextViswanathan, A. (1972) On the application of Wilson's variance–range analysis to polymeric X-ray diffraction profiles. Journal of Applied Crystallography, 5 (4) 300 doi:10.1107/s0021889872009550
In(1972, August) Journal of Applied Crystallography Vol. 5 (4) International Union of Crystallography (IUCr)

See Also

These are possibly similar items as determined by title/reference text matching only.

Wilson, A. J. C. (1972) Comments on the application of variance analysis to the X-ray diffraction of polymers. Journal of Applied Crystallography, 5 (4) 301-302 doi:10.1107/s0021889872009562
Kulshreshitha, A. K., Dweltz, N. E., Radhakrishnan, T. (1971) Analysis of polymeric X-ray diffraction profiles. I. Theory and application of the variance method. Journal of Applied Crystallography, 4 (2) 116-125 doi:10.1107/s0021889871006460
Kulshreshtha, A. K., Kothari, N. R., Dweltz, N. E. (1971) Analysis of polymeric X-ray diffraction profiles. II. The significance of the fourth moment–range function of the diffraction profile in the analysis of first order reflexions. Journal of Applied Crystallography, 4 (2) 125-130 doi:10.1107/s0021889871006472
Hilleard, R. J., Webster, J. A. (1969) A program to calculate the variance of X-ray line profiles. Journal of Applied Crystallography, 2 (5) 193-196 doi:10.1107/s0021889869006960
Cheary, R. W., Grimes, N. W. (1972) The application of truncated integrated intensity to the analysis of broadened X-ray diffraction lines. Journal of Applied Crystallography, 5 (2) 57-63 doi:10.1107/s0021889872008775
Lambert, Sébastien, Guillet, François (2008) Application of the X-ray tracing method to powder diffraction line profiles. Journal of Applied Crystallography, 41 (1). 153-160 doi:10.1107/s0021889807055069
Gangulee, A. (1970) Separation of the α1-α2doublet in X-ray diffraction profiles. Journal of Applied Crystallography, 3 (4) 272-277 doi:10.1107/s0021889870006179
Lonsdale, D. (1986) The accuracy of stress measurement using the X-ray diffraction method. Journal of Applied Crystallography, 19 (5) 300-307 doi:10.1107/s002188988608932x
Nandi, R. K., Sen Gupta, S. P. (1978) The analysis of X-ray diffraction profiles from imperfect solids by an application of convolution relations. Journal of Applied Crystallography, 11 (1) 6-9 doi:10.1107/s0021889878012595
Szabó, P. (1982) Addenda to the optimization of quantitative X-ray diffraction analysis. Journal of Applied Crystallography, 15 (4) 449-451 doi:10.1107/s0021889882012345
Vasudevan, R. (1970) Application of Fourier analysis to the X-ray diffraction pattern of filings of a face-centred cubic copper–silicon–manganese alloy. Journal of Applied Crystallography, 3 (4) 211-213 doi:10.1107/s0021889870006064
 
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