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Rezikyan, Aram, Belcourt, James A., Treacy, Michael M. J. (2015) Interferometric Diffraction from Amorphous Double Films. Microscopy and Microanalysis, 21 (5). 1348-1360 doi:10.1017/s1431927615014981

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Reference TypeJournal (article/letter/editorial)
TitleInterferometric Diffraction from Amorphous Double Films
JournalMicroscopy and Microanalysis
AuthorsRezikyan, AramAuthor
Belcourt, James A.Author
Treacy, Michael M. J.Author
Year2015 (October)Volume21
Issue5
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927615014981Search in ResearchGate
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Mindat Ref. ID4875682Long-form Identifiermindat:1:5:4875682:2
GUID0
Full ReferenceRezikyan, Aram, Belcourt, James A., Treacy, Michael M. J. (2015) Interferometric Diffraction from Amorphous Double Films. Microscopy and Microanalysis, 21 (5). 1348-1360 doi:10.1017/s1431927615014981
Plain TextRezikyan, Aram, Belcourt, James A., Treacy, Michael M. J. (2015) Interferometric Diffraction from Amorphous Double Films. Microscopy and Microanalysis, 21 (5). 1348-1360 doi:10.1017/s1431927615014981
In(2015, October) Microscopy and Microanalysis Vol. 21 (5) Cambridge University Press (CUP)

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Zjajo, Armin, Matzkevich, Itai, Du, Hongchu, Dunin-Borkowski, Rafal, Rezikyan, Aram, Treacy, Michael (2021) Reducing Decoherence in Fluctuation Electron Microscopy. Microscopy and Microanalysis, 27. 1776-1777 doi:10.1017/s1431927621006498
Zjajo, Armin; Du, Hongchu; Dunin-Borkowski, Rafal E; Gibson, J Murray; Rezikyan, Aram; Treacy, Michael M J (2025) Rapid-Acquisition Fluctuation Electron Microscopy: Decoherence and the Dominant Role of Noise. Microscopy and Microanalysis, 31 (3). doi:10.1093/mam/ozaf049
Rezikyan, A., Treacy, M., Sun, T., Koeck, F., Nemanich, R. (2012) TEM observation of nitrogen-doped diamond films. Microscopy and Microanalysis, 18. 1558-1559 doi:10.1017/s1431927612009646
Rezikyan, A, Zhao, G, Treacy, M (2011) Incoherence, Decoherence and Speckle Statistics in Fluctuation Microscopy. Microscopy and Microanalysis, 17. 1546-1547 doi:10.1017/s1431927611008609
Rezikyan, A., Jibben, Z., Rock, B., Zhao, G., Treacy, M. M. J. (2014) Simulation of Decoherence in Fluctuation Electron Microscopy. Microscopy and Microanalysis, 20. 150-151 doi:10.1017/s1431927614002475
Rezikyan, A., Jibben, Z., Rock, B., Zhao, G., Treacy, M. (2013) Simulation of Decoherence in Fluctuation Electron Microscopy. Microscopy and Microanalysis, 19. 1592-1593 doi:10.1017/s1431927613009951
Sun, Tianyin, Koeck, Franz A. M., Rezikyan, Aram, Treacy, Michael M. J., Nemanich, Robert J. (2014) Thermally enhanced photoinduced electron emission from nitrogen-doped diamond films on silicon substrates. Physical Review B, 90 (12) doi:10.1103/physrevb.90.121302
Zjajo, A, Du, H, Dunin-Borkowski, R E, Rezikyan, A, Gibson, J M, Treacy, M M J (2024) The “Platform 9¾ Problem” in Fluctuation Electron Microscopy. Microscopy and Microanalysis, 30. doi:10.1093/mam/ozae044.937
Treacy, Michael M. J. (2005) Fluctuation Microscopy: What is it?. Microscopy Today, 13 (5). 20-21 doi:10.1017/s1551929500053761
Zjajo, Armin, Matzkevich, Itai, Rezikyan, Aram, Du, Hongchu, Dunin-Borkowski, Rafal (2021) Estimating illumination coherence width from focused-probe intensity profiles. Microscopy and Microanalysis, 27. 738-740 doi:10.1017/s1431927621002981
 
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