Log InRegister
Quick Links : The Mindat ManualThe Rock H. Currier Digital LibraryMindat Newsletter [Free Download]
Home PageAbout MindatThe Mindat ManualHistory of MindatCopyright StatusWho We AreContact UsAdvertise on Mindat
Donate to MindatCorporate SponsorshipSponsor a PageSponsored PagesMindat AdvertisersAdvertise on Mindat
Learning CenterWhat is a mineral?The most common minerals on earthInformation for EducatorsMindat ArticlesThe ElementsThe Rock H. Currier Digital LibraryGeologic Time
Minerals by PropertiesMinerals by ChemistryMineral Visual ExplorerAdvanced Locality SearchRandom MineralRandom LocalitySearch by minIDLocalities Near MeSearch ArticlesSearch GlossaryMore Search Options
Search For:
Mineral Name:
Locality Name:
Keyword(s):
 
The Mindat ManualAdd a New PhotoRate PhotosLocality Edit ReportCoordinate Completion ReportAdd Glossary Item
Mining CompaniesStatisticsUsersMineral MuseumsClubs & OrganizationsMineral Shows & EventsThe Mindat DirectoryDevice SettingsThe Mineral QuizTime Machine
Photo SearchPhoto GalleriesSearch by ColorPhoto Colour ExplorerNew Photos TodayNew Photos YesterdayMembers' Photo GalleriesPast Photo of the Day GalleryPhotography

Trampert, Patrick, Bogachev, Sviatoslav, Marniok, Nico, Dahmen, Tim, Slusallek, Philipp (2015) Marker Detection in Electron Tomography: A Comparative Study. Microscopy and Microanalysis, 21 (6). 1591-1601 doi:10.1017/s1431927615015433

Advanced
   -   Only viewable:
Reference TypeJournal (article/letter/editorial)
TitleMarker Detection in Electron Tomography: A Comparative Study
JournalMicroscopy and Microanalysis
AuthorsTrampert, PatrickAuthor
Bogachev, SviatoslavAuthor
Marniok, NicoAuthor
Dahmen, TimAuthor
Slusallek, PhilippAuthor
Year2015 (December)Volume21
Issue6
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927615015433Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID4875800Long-form Identifiermindat:1:5:4875800:6
GUID0
Full ReferenceTrampert, Patrick, Bogachev, Sviatoslav, Marniok, Nico, Dahmen, Tim, Slusallek, Philipp (2015) Marker Detection in Electron Tomography: A Comparative Study. Microscopy and Microanalysis, 21 (6). 1591-1601 doi:10.1017/s1431927615015433
Plain TextTrampert, Patrick, Bogachev, Sviatoslav, Marniok, Nico, Dahmen, Tim, Slusallek, Philipp (2015) Marker Detection in Electron Tomography: A Comparative Study. Microscopy and Microanalysis, 21 (6). 1591-1601 doi:10.1017/s1431927615015433
In(2015, December) Microscopy and Microanalysis Vol. 21 (6) Cambridge University Press (CUP)

See Also

These are possibly similar items as determined by title/reference text matching only.

Trampert, Patrick, Bogachev, Sviatoslav, Dahmen, Tim, Slusallek, Philipp (2016) A Comparative Study of Three Marker Detection Algorithms in Electron Tomography. Microscopy and Microanalysis, 22. 1044-1045 doi:10.1017/s1431927616006061
Dahmen, Tim, Marsalek *, Lukas, Marniok *, Nico, Turoňová, Beata, Bogachev, Sviatoslav, Trampert, Patrick, Nickels, Stefan, Slusallek, Philipp (2015) Ettention: Building Blocks for Iterative Reconstruction Algorithms. Microscopy and Microanalysis, 21. 1601-1602 doi:10.1017/s1431927615008788
Trampert, Patrick, Chen, Delei, Bogachev, Sviatoslav, Dahmen, Tim, Slusallek, Philipp (2016) Dictionary-based Filling of the Missing Wedge in Electron Tomography. Microscopy and Microanalysis, 22. 554-555 doi:10.1017/s1431927616003627
Dahmen, Tim, Marsalek, Lukas, Marniok, Nico, Turoňová, Beata, Bogachev, Sviatoslav, Trampert, Patrick, Nickels, Stefan, Slusallek, Philipp (2016) The Ettention software package. Ultramicroscopy, 161. 110-118 doi:10.1016/j.ultramic.2015.10.012
Trampert, Patrick, Schlabach, Sabine, Dahmen, Tim, Slusallek, Philipp (2019) Deep Learning for Sparse Scanning Electron Microscopy. Microscopy and Microanalysis, 25. 158-159 doi:10.1017/s1431927619001521
Trampert, Patrick, Dahmen, Tim, Slusallek, Philipp (2019) Application of Missing Wedge Inpainting in Material Science. Microscopy and Microanalysis, 25. 440-441 doi:10.1017/s1431927619002939
Trampert, Patrick, Schlabach, Sabine, Dahmen, Tim, Slusallek, Philipp (2018) Exemplar-Based Inpainting Based on Dictionary Learning for Sparse Scanning Electron Microscopy. Microscopy and Microanalysis, 24. 700-701 doi:10.1017/s1431927618003999
Dahmen, Tim, Trampert, Patrick, Slusallek, Philipp (2018) Blob-based Algebraic Reconstruction Technique for Computed Laminography. Microscopy and Microanalysis, 24. 994-995 doi:10.1017/s1431927618005469
Trampert, Patrick, Dahmen, Tim, Slusallek, Philipp (2018) Fact or Fiction: Maximal Image Quality with Minimal Dwell Time. Microscopy and Microanalysis, 24. 480-481 doi:10.1017/s1431927618002891
Dahmen, Tim, de Jonge, Niels, Trampert, Patrick, Engstler, Michael, Pauly, Christoph, Mücklich, Frank, Slusallek, Philipp (2016) “Smart Microscopy”: Feature Based Adaptive Sampling for Focused Ion Beam Scanning Electron Microscopy. Microscopy and Microanalysis, 22. 632-633 doi:10.1017/s1431927616004013
Dahmen, Tim, Kohr, Holger, de Jonge, Niels, Slusallek, Philipp (2015) Reconstruction Strategies for Combined Tilt- and Focal Series Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 21. 2337-2338 doi:10.1017/s1431927615012465
 
and/or  
Mindat.org® is an outreach project of the Hudson Institute of Mineralogy, a 501(c)(3) not-for-profit organization. Mindat® and mindat.org® are registered trademarks of the Hudson Institute of Mineralogy.
Copyright © mindat.org and the Hudson Institute of Mineralogy 1993-2026, except where stated. Most political location boundaries are © OpenStreetMap contributors. Mindat.org relies on the contributions of thousands of members and supporters. Founded in 2000 by Jolyon Ralph and Ida Chau.
To cite: Ralph, J., Von Bargen, D., Martynov, P., Zhang, J., Que, X., Prabhu, A., Morrison, S. M., Li, W., Chen, W., & Ma, X. (2025). Mindat.org: The open access mineralogy database to accelerate data-intensive geoscience research. American Mineralogist, 110(6), 833–844. doi:10.2138/am-2024-9486.
Privacy Policy - Terms & Conditions - Contact Us / DMCA issues - Report a bug/vulnerability Current server date and time: June 5, 2026 12:07:52
Go to top of page