| Reference Type | Journal (article/letter/editorial) |
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| Title | How to Set Up Your STEM for EELS at Very High Energy Losses |
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| Journal | Microscopy and Microanalysis |
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| Authors | MacLaren, Ian | Author |
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| Craven, Alan J. | Author |
| Black, Colin | Author |
| McFadzean, Sam | Author |
| Sawada, Hidetaka | Author |
| Year | 2017 (July) | Volume | 23 |
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| Page(s) | 1080-1081 |
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| Publisher | Cambridge University Press (CUP) |
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| DOI | doi:10.1017/s1431927617006067Search in ResearchGate |
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| Mindat Ref. ID | 4880588 | Long-form Identifier | mindat:1:5:4880588:1 |
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|
| GUID | 5933f1ea-ae23-4da5-ae1c-cc3c8537c2d3 |
|---|
| Full Reference | MacLaren, Ian, Craven, Alan J., Black, Colin, McFadzean, Sam, Sawada, Hidetaka (2017) How to Set Up Your STEM for EELS at Very High Energy Losses. Microscopy and Microanalysis, 23. 1080-1081 doi:10.1017/s1431927617006067 |
|---|
| Plain Text | MacLaren, Ian, Craven, Alan J., Black, Colin, McFadzean, Sam, Sawada, Hidetaka (2017) How to Set Up Your STEM for EELS at Very High Energy Losses. Microscopy and Microanalysis, 23. 1080-1081 doi:10.1017/s1431927617006067 |
|---|
| In | (2017) Microscopy and Microanalysis Vol. 23. Cambridge University Press (CUP) |
|---|
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