Sader, John E., Chon, James W. M., Mulvaney, Paul (1999) Calibration of rectangular atomic force microscope cantilevers. Review of Scientific Instruments, 70 (10). 3967-3969 doi:10.1063/1.1150021

References Listed

These are the references the publisher has listed as being connected to the article. Please check the article itself for the full list of references which may differ. Not all references are currently linkable within the Digital Library.

	Senden, Tim, Ducker, William (1994) Experimental Determination of Spring Constants in Atomic Force Microscopy. Langmuir, 10. 1003-1004 doi:10.1021/la00016a600
	Li, Y. Q., Tao, N. J., Pan, J., Garcia, A. A., Lindsay, S. M. (1993) Direct measurement of interaction forces between colloidal particles using the scanning force microscope. Langmuir, 9. 637-641 doi:10.1021/la00027a003
	Hutter, Jeffrey L., Bechhoefer, John (1993) Calibration of atomic‐force microscope tips. Review of Scientific Instruments, 64 (7). 1868-1873 doi:10.1063/1.1143970
	Cleveland, J. P., Manne, S., Bocek, D., Hansma, P. K. (1993) A nondestructive method for determining the spring constant of cantilevers for scanning force microscopy. Review of Scientific Instruments, 64 (2). 403-405 doi:10.1063/1.1144209
	Sader, John E., Larson, Ian, Mulvaney, Paul, White, Lee R. (1995) Method for the calibration of atomic force microscope cantilevers. Review of Scientific Instruments, 66 (7). 3789-3798 doi:10.1063/1.1145439
	Sader, John Elie (1998) Frequency response of cantilever beams immersed in viscous fluids with applications to the atomic force microscope. Journal of Applied Physics, 84 (1). 64-76 doi:10.1063/1.368002
	Walters, D. A., Cleveland, J. P., Thomson, N. H., Hansma, P. K., Wendman, M. A., Gurley, G., Elings, V. (1996) Short cantilevers for atomic force microscopy. Review of Scientific Instruments, 67 (10). 3583-3590 doi:10.1063/1.1147177
	Not Yet Imported: SPIE Proceedings - proceedings-article : 10.1117/12.271229 If you would like this item imported into the Digital Library, please contact us quoting Journal ID
	Sader, John Elie, White, Lee (1993) Theoretical analysis of the static deflection of plates for atomic force microscope applications. Journal of Applied Physics, 74 (1). 1-9 doi:10.1063/1.354137
	Sader, John Elie (1995) Parallel beam approximation for V‐shaped atomic force microscope cantilevers. Review of Scientific Instruments, 66 (9). 4583-4587 doi:10.1063/1.1145292
	Neumeister, Jonas M., Ducker, William A. (1994) Lateral, normal, and longitudinal spring constants of atomic force microscopy cantilevers. Review of Scientific Instruments, 65 (8). 2527-2531 doi:10.1063/1.1144646

See Also

These are possibly similar items as determined by title/reference text matching only.

	Sader, John E., Larson, Ian, Mulvaney, Paul, White, Lee R. (1995) Method for the calibration of atomic force microscope cantilevers. Review of Scientific Instruments, 66 (7). 3789-3798 doi:10.1063/1.1145439
	Sader, John E., Friend, James R. (2015) Note: Improved calibration of atomic force microscope cantilevers using multiple reference cantilevers. Review of Scientific Instruments, 86 (5). 56106pp. doi:10.1063/1.4921192
	Sader, John E., Sanelli, Julian A., Adamson, Brian D., Monty, Jason P., Wei, Xingzhan, Crawford, Simon A., Friend, James R., Marusic, Ivan, Mulvaney, Paul, Bieske, Evan J. (2012) Spring constant calibration of atomic force microscope cantilevers of arbitrary shape. Review of Scientific Instruments, 83 (10). 103705pp. doi:10.1063/1.4757398
	Sader, John E., Friend, James R. (2014) Note: Calibration of atomic force microscope cantilevers using only their resonant frequency and quality factor. Review of Scientific Instruments, 85 (11). 116101pp. doi:10.1063/1.4901227
	Green, Christopher P., Lioe, Hadi, Cleveland, Jason P., Proksch, Roger, Mulvaney, Paul, Sader, John E. (2004) Normal and torsional spring constants of atomic force microscope cantilevers. Review of Scientific Instruments, 75 (6). 1988-1996 doi:10.1063/1.1753100
	Chon, James W. M., Mulvaney, Paul, Sader, John E. (2000) Experimental validation of theoretical models for the frequency response of atomic force microscope cantilever beams immersed in fluids. Journal of Applied Physics, 87 (8). 3978-3988 doi:10.1063/1.372455
	Sader, John Elie (2003) Susceptibility of atomic force microscope cantilevers to lateral forces. Review of Scientific Instruments, 74 (4). 2438-2443 doi:10.1063/1.1544421
	Sader, John Elie (1995) Parallel beam approximation for V‐shaped atomic force microscope cantilevers. Review of Scientific Instruments, 66 (9). 4583-4587 doi:10.1063/1.1145292
	Sader, John E., Lu, Jianing, Mulvaney, Paul (2014) Effect of cantilever geometry on the optical lever sensitivities and thermal noise method of the atomic force microscope. Review of Scientific Instruments, 85 (11). 113702pp. doi:10.1063/1.4900864
	Thomson, R. E. (1999) Low-temperature atomic force microscope using piezoresistive cantilevers. Review of Scientific Instruments, 70 (8). 3369-3372 doi:10.1063/1.1149945
	Sader, John E., Borgani, Riccardo, Gibson, Christopher T., Haviland, David B., Higgins, Michael J., Kilpatrick, Jason I., Lu, Jianing, Mulvaney, Paul, Shearer, Cameron J., Slattery, Ashley D., Thorén, Per-Anders, Tran, Jim, Zhang, Heyou, Zhang, Hongrui, Zheng, Tian (2016) A virtual instrument to standardise the calibration of atomic force microscope cantilevers. Review of Scientific Instruments, 87 (9). 93711pp. doi:10.1063/1.4962866