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Rice, Katherine P., Ulfig, Robert M., Chen, Yimeng, Prosa, Ty J., Larson, David J. (2018) Grain Boundary Analysis of Inconel 718 Using a Novel Atom Probe Design. Microscopy and Microanalysis, 24. 2212-2213 doi:10.1017/s1431927618011546

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Reference TypeJournal (article/letter/editorial)
TitleGrain Boundary Analysis of Inconel 718 Using a Novel Atom Probe Design
JournalMicroscopy and Microanalysis
AuthorsRice, Katherine P.Author
Ulfig, Robert M.Author
Chen, YimengAuthor
Prosa, Ty J.Author
Larson, David J.Author
Year2018 (August)Volume24
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927618011546Search in ResearchGate
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Mindat Ref. ID4884591Long-form Identifiermindat:1:5:4884591:3
GUID0
Full ReferenceRice, Katherine P., Ulfig, Robert M., Chen, Yimeng, Prosa, Ty J., Larson, David J. (2018) Grain Boundary Analysis of Inconel 718 Using a Novel Atom Probe Design. Microscopy and Microanalysis, 24. 2212-2213 doi:10.1017/s1431927618011546
Plain TextRice, Katherine P., Ulfig, Robert M., Chen, Yimeng, Prosa, Ty J., Larson, David J. (2018) Grain Boundary Analysis of Inconel 718 Using a Novel Atom Probe Design. Microscopy and Microanalysis, 24. 2212-2213 doi:10.1017/s1431927618011546
In(2018) Microscopy and Microanalysis Vol. 24. Cambridge University Press (CUP)

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