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Sun, Cheng, Müller, Erich, Meffert, Matthias, Gerthsen, Dagmar (2018) On the Progress of Scanning Transmission Electron Microscopy (STEM) Imaging in a Scanning Electron Microscope. Microscopy and Microanalysis, 24 (2). 99-106 doi:10.1017/s1431927618000181

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Reference TypeJournal (article/letter/editorial)
TitleOn the Progress of Scanning Transmission Electron Microscopy (STEM) Imaging in a Scanning Electron Microscope
JournalMicroscopy and Microanalysis
AuthorsSun, ChengAuthor
Müller, ErichAuthor
Meffert, MatthiasAuthor
Gerthsen, DagmarAuthor
Year2018 (April)Volume24
Issue2
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927618000181Search in ResearchGate
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Mindat Ref. ID4885367Long-form Identifiermindat:1:5:4885367:5
GUID0
Full ReferenceSun, Cheng, Müller, Erich, Meffert, Matthias, Gerthsen, Dagmar (2018) On the Progress of Scanning Transmission Electron Microscopy (STEM) Imaging in a Scanning Electron Microscope. Microscopy and Microanalysis, 24 (2). 99-106 doi:10.1017/s1431927618000181
Plain TextSun, Cheng, Müller, Erich, Meffert, Matthias, Gerthsen, Dagmar (2018) On the Progress of Scanning Transmission Electron Microscopy (STEM) Imaging in a Scanning Electron Microscope. Microscopy and Microanalysis, 24 (2). 99-106 doi:10.1017/s1431927618000181
In(2018, April) Microscopy and Microanalysis Vol. 24 (2) Cambridge University Press (CUP)

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Li, Yonghe, Müller, Erich, Sprau, Christian, Colsmann, Alexander, Gerthsen, Dagmar (2019) Correlative STEM and SEM Imaging of PTB7:PC71BM-Based Photoactive Layers in a Scanning Electron Microscope. Microscopy and Microanalysis, 25. 1800-1801 doi:10.1017/s1431927619009735
Volkenandt, Tobias, Müller, Erich, Gerthsen, Dagmar (2014) Sample Thickness Determination by Scanning Transmission Electron Microscopy at Low Electron Energies. Microscopy and Microanalysis, 20 (1). 111-123 doi:10.1017/s1431927613013913
Sun, Cheng, Müller, Erich, Gerthsen, Dagmar (2019) On the Benefits of Obtaining Surface Topography and Volume Structure Information by Correlative S(T)EM in a Scanning Electron Microscope. Microscopy and Microanalysis, 25. 73-74 doi:10.1017/s1431927618016094
Sun, Cheng, Lux, Stefan, Müller, Erich, Meffert, Matthias, Gerthsen, Dagmar (2020) Versatile application of a modern scanning electron microscope for materials characterization. Journal of Materials Science, 55 (28) 13824-13835 doi:10.1007/s10853-020-04970-3
Müller, E, Volkenandt, T, Hu, DZ, Schaadt, DM, Gerthsen, D (2010) Quantitative Analysis by Electron Transmission Measurements in a Scanning Electron Microscope. Microscopy and Microanalysis, 16. 612-613 doi:10.1017/s1431927610056151
Čalkovský, Martin, Müller, Erich, Gerthsen, Dagmar (2023) Quantitative analysis of backscattered‐electron contrast in scanning electron microscopy. Journal of Microscopy, 289 (1) 32-47 doi:10.1111/jmi.13148
Volkenandt, T., Müller, E., Gerthsen, D. (2014) Sample Thickness Determination By Scanning Transmission Electron Microscopy At Low Electron Energies. Microscopy and Microanalysis, 20. 142-143 doi:10.1017/s1431927614002438
Müller, Philipp, Meffert, Matthias, Störmer, Heike, Gerthsen, Dagmar (2013) Fast Mapping of the Cobalt-Valence State in Ba0.5Sr0.5Co0.8Fe0.2O3-d by Electron Energy Loss Spectroscopy. Microscopy and Microanalysis, 19 (6). 1595-1605 doi:10.1017/s1431927613013536
Pfaff, Marina, Klein, Michael F.G., Müller, Erich, Müller, Philipp, Colsmann, Alexander, Lemmer, Uli, Gerthsen, Dagmar (2012) Nanomorphology of P3HT:PCBM-Based Absorber Layers of Organic Solar Cells after Different Processing Conditions Analyzed by Low-Energy Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 18 (6). 1380-1388 doi:10.1017/s143192761201344x
Dries, Manuel, Hettler, Simon, Gamm, Björn, Müller, Erich, Send, Winfried, Gerthsen, Dagmar, Müller, Knut, Rosenauer, Andreas (2014) A Nanocrystalline Hilbert Phase-Plate for Phase-Contrast Transmission Electron Microscopy. Microscopy and Microanalysis, 20. 236-237 doi:10.1017/s1431927614002906
 
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