Wu, Hanglong, Ianiro, Alessandro, van Rijt, Mark M. J., Keizer, Arthur D. A., Esteves, A. Catarina C., Tuinier, Remco, Friedrich, Heiner, Sommerdijk, Nico. A.J.M., Patterson, Joseph P. (2019) In-Situ Liquid Phase Electron Microscopy of Beam-Sensitive Materials. Microscopy and Microanalysis, 25. 63-64 doi:10.1017/s1431927618016045
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | In-Situ Liquid Phase Electron Microscopy of Beam-Sensitive Materials | ||
| Journal | Microscopy and Microanalysis | ||
| Authors | Wu, Hanglong | Author | |
| Ianiro, Alessandro | Author | ||
| van Rijt, Mark M. J. | Author | ||
| Keizer, Arthur D. A. | Author | ||
| Esteves, A. Catarina C. | Author | ||
| Tuinier, Remco | Author | ||
| Friedrich, Heiner | Author | ||
| Sommerdijk, Nico. A.J.M. | Author | ||
| Patterson, Joseph P. | Author | ||
| Year | 2019 (February) | Volume | 25 |
| Publisher | Cambridge University Press (CUP) | ||
| DOI | doi:10.1017/s1431927618016045Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 4885589 | Long-form Identifier | mindat:1:5:4885589:5 |
| GUID | 0 | ||
| Full Reference | Wu, Hanglong, Ianiro, Alessandro, van Rijt, Mark M. J., Keizer, Arthur D. A., Esteves, A. Catarina C., Tuinier, Remco, Friedrich, Heiner, Sommerdijk, Nico. A.J.M., Patterson, Joseph P. (2019) In-Situ Liquid Phase Electron Microscopy of Beam-Sensitive Materials. Microscopy and Microanalysis, 25. 63-64 doi:10.1017/s1431927618016045 | ||
| Plain Text | Wu, Hanglong, Ianiro, Alessandro, van Rijt, Mark M. J., Keizer, Arthur D. A., Esteves, A. Catarina C., Tuinier, Remco, Friedrich, Heiner, Sommerdijk, Nico. A.J.M., Patterson, Joseph P. (2019) In-Situ Liquid Phase Electron Microscopy of Beam-Sensitive Materials. Microscopy and Microanalysis, 25. 63-64 doi:10.1017/s1431927618016045 | ||
| In | (2019) Microscopy and Microanalysis Vol. 25. Cambridge University Press (CUP) | ||
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