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Shibata, N. (2019) Differential Phase Contrast Scanning Transmission Electron Microscopy at Atomic Resolution. Microscopy and Microanalysis, 25. 14-15 doi:10.1017/s1431927619000801

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Reference TypeJournal (article/letter/editorial)
TitleDifferential Phase Contrast Scanning Transmission Electron Microscopy at Atomic Resolution
JournalMicroscopy and Microanalysis
AuthorsShibata, N.Author
Year2019 (August)Volume25
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927619000801Search in ResearchGate
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Mindat Ref. ID4885626Long-form Identifiermindat:1:5:4885626:5
GUID0
Full ReferenceShibata, N. (2019) Differential Phase Contrast Scanning Transmission Electron Microscopy at Atomic Resolution. Microscopy and Microanalysis, 25. 14-15 doi:10.1017/s1431927619000801
Plain TextShibata, N. (2019) Differential Phase Contrast Scanning Transmission Electron Microscopy at Atomic Resolution. Microscopy and Microanalysis, 25. 14-15 doi:10.1017/s1431927619000801
In(2019) Microscopy and Microanalysis Vol. 25. Cambridge University Press (CUP)

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Shibata, Naoya (2022) Differential Phase Contrast Imaging by Magnetic-field-free Atomic Resolution Scanning Transmission Electron Microscope. Microscopy and Microanalysis, 28. 2568-2569 doi:10.1017/s1431927622009783
Shibata, Naoya (2024) Direct Magnetic Field Imaging by Advanced Differential Phase Contrast Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 30. doi:10.1093/mam/ozae044.502
Wu, Mingjian, Tafel, Alexander, Hommelhoff, Peter, Spiecker, Erdmann (2019) Three-Dimensional Electrostatic Field at an Electron Nano-Emitter Determined by Differential Phase Contrast in Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 25. 74-75 doi:10.1017/s1431927619001107
Shibata, Naoya (2024) Towards In Situ Electromagnetic Field Imaging by Differential Phase Contrast Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 30. doi:10.1093/mam/ozae044.798
Shibata, N, Findlay, S, Ikuhara, Y (2011) Atomic-Resolution Differential Phase Contrast Imaging by STEM. Microscopy and Microanalysis, 17. 1256-1257 doi:10.1017/s143192761100715x
Shibata, N., Findlay, S.D., Ikuhara, Y. (2014) Atomic-Resolution Scanning Transmission Electron Microscopy with Segmented Annular All Field Detector. Microscopy and Microanalysis, 20. 64-65 doi:10.1017/s1431927614002049
Shibata, Naoya (2024) Field and Structure Imaging by Magnetic-field-free Atomic Resolution Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 30. doi:10.1093/mam/ozae044.676
Shibata, N., Findlay, S.D., Matsumoto, T., Seki, T., Sánchez-Santolino, G., Kohno, Y., Sawada, H., Sasaki, H., So, Y.G., Ishikawa, R., Ikuhara, Y. (2016) Direct Electromagnetic Structure Observation by Aberration-corrected Differential Phase Contrast Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 22. 906-907 doi:10.1017/s1431927616005377
Oxley, Mark P. (2019) Spatial and Temporal Incoherence in Scanning Diffraction and Differential Phase Contrast. Microscopy and Microanalysis, 25. 78-79 doi:10.1017/s1431927619001120
Findlay, Scott D., Oxley, Mark P., Allen, Leslie J. (2008) Modeling Atomic-Resolution Scanning Transmission Electron Microscopy Images. Microscopy and Microanalysis, 14 (1). 48-59 doi:10.1017/s1431927608080112
SHIBATA, Naoya (2019) Atomic-resolution differential phase contrast electron microscopy. Journal of the Ceramic Society of Japan, 127 (10) 708-714 doi:10.2109/jcersj2.19118
 
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