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Song, Biying, Ding, Zhiyuan, Allen, Christopher, Sawada, Hidetaka, Pan, Xiaoqing, Kirkland, Angus I., Wang, Peng (2019) Electron ptychography using an ultrafast direct electron detector. Microscopy and Microanalysis, 25. 20-21 doi:10.1017/s1431927619000837

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Reference TypeJournal (article/letter/editorial)
TitleElectron ptychography using an ultrafast direct electron detector
JournalMicroscopy and Microanalysis
AuthorsSong, BiyingAuthor
Ding, ZhiyuanAuthor
Allen, ChristopherAuthor
Sawada, HidetakaAuthor
Pan, XiaoqingAuthor
Kirkland, Angus I.Author
Wang, PengAuthor
Year2019 (August)Volume25
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927619000837Search in ResearchGate
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Mindat Ref. ID4885633Long-form Identifiermindat:1:5:4885633:5
GUID0
Full ReferenceSong, Biying, Ding, Zhiyuan, Allen, Christopher, Sawada, Hidetaka, Pan, Xiaoqing, Kirkland, Angus I., Wang, Peng (2019) Electron ptychography using an ultrafast direct electron detector. Microscopy and Microanalysis, 25. 20-21 doi:10.1017/s1431927619000837
Plain TextSong, Biying, Ding, Zhiyuan, Allen, Christopher, Sawada, Hidetaka, Pan, Xiaoqing, Kirkland, Angus I., Wang, Peng (2019) Electron ptychography using an ultrafast direct electron detector. Microscopy and Microanalysis, 25. 20-21 doi:10.1017/s1431927619000837
In(2019) Microscopy and Microanalysis Vol. 25. Cambridge University Press (CUP)

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Song, Jiamei, Song, Biying, Zou, Liqi, Allen, Christopher, Sawada, Hidetaka, Zhang, Fucai, Pan, Xiaoqing, Kirkland, Angus. I., Wang, Peng (2018) Fast and Low-dose Electron Ptychography. Microscopy and Microanalysis, 24. 224-225 doi:10.1017/s1431927618001617
Gao, Si, Ding, Zhiyuan, Pan, Xiaoqing, Kirkland, Angus I., Wang, Peng (2019) 3D Electron Ptychography. Microscopy and Microanalysis, 25. 1802-1803 doi:10.1017/s1431927619009747
Song, Biying, Ding, Zhiyuan, Allen, Christopher S., Sawada, Hidetaka, Zhang, Fucai, Pan, Xiaoqing, Warner, Jamie, Kirkland, Angus I., Wang, Peng (2018) Hollow Electron Ptychographic Diffractive Imaging. Physical Review Letters, 121 (14). doi:10.1103/physrevlett.121.146101
Lei, Yu, Song, Biying, Ding, Zhiyuan, Pan, Xiaoqing, Kirkland, Angus I, Wang, Peng (2024) Multidimensional Ptychography and 4D STEM. Microscopy and Microanalysis, 30. doi:10.1093/mam/ozae044.944
Song, Jiamei, Allen, Christopher S., Gao, Si, Huang, Chen, Sawada, Hidetaka, Pan, Xiaoqing, Warner, Jamie, Wang, Peng, Kirkland, Angus I. (2019) Atomic Resolution Defocused Electron Ptychography at Low Dose with a Fast, Direct Electron Detector. Scientific Reports, 9. doi:10.1038/s41598-019-40413-z
Allen, Christopher S., Song, Jiamei, Danaie, Mohsen, Wang, Peng, Kirkland, Angus I. (2018) Low Dose Defocused Probe Electron Ptychography Using a Fast Direct Electron Detector. Microscopy and Microanalysis, 24. 186-187 doi:10.1017/s1431927618001423
Zhou, Liqi, Song, Jingdong, Kim, Judy, Pei, Xudong, Huang, Chen, Pan, Xiaoqing, Nellist, Peter, Zhang, Peijun, Kirkland, Angus, Wang, Peng (2020) Low Dose Electron Ptychography for Cryo-biological Imaging. Microscopy and Microanalysis, 26. 1488-1490 doi:10.1017/s1431927620018292
Gao, Si, Zhang, Fucai, Kirkland, A. I., Pan, Xiaoqing, Wang, Peng (2017) Electron Ptychography: From 2D to 3D Reconstructions. Microscopy and Microanalysis, 23. 346-347 doi:10.1017/s1431927617002410
Ding, Zhiyuan, Gao, Si, Fang, Weina, Huang, Chen, Zhou, Liqi, Pei, Xudong, Liu, Xiaoguo, Pan, Xiaoqing, Fan, Chunhai, Kirkland, Angus I., Wang, Peng (2022) Three-dimensional electron ptychography of organic–inorganic hybrid nanostructures. Nature Communications, 13 (1) doi:10.1038/s41467-022-32548-x
Sawada, Hidetaka, Ramlau, Reiner, Allen, Christopher S., Kirkland, Angus I. (2017) Characterization of thin film displacements in the electron microscope. Applied Physics Letters, 111 (20). 203104pp. doi:10.1063/1.4999003
Haigh, Sarah J., Sawada, Hidetaka, Takayanagi, Kunio, Kirkland, Angus I. (2010) Exceeding Conventional Resolution Limits in High-Resolution Transmission Electron Microscopy Using Tilted Illumination and Exit-Wave Restoration. Microscopy and Microanalysis, 16 (4). 409-415 doi:10.1017/s1431927610093359
 
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