Brown, H. G., Chen, Z., Weyland, M., Ophus, C., Ciston, J., Allen, L. J., Findlay, S. D. (2019) Structure Retrieval of Strongly Scattering Materials in the Transmission Electron Microscope. Microscopy and Microanalysis, 25. 76-77 doi:10.1017/s1431927619001119
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Structure Retrieval of Strongly Scattering Materials in the Transmission Electron Microscope | ||
| Journal | Microscopy and Microanalysis | ||
| Authors | Brown, H. G. | Author | |
| Chen, Z. | Author | ||
| Weyland, M. | Author | ||
| Ophus, C. | Author | ||
| Ciston, J. | Author | ||
| Allen, L. J. | Author | ||
| Findlay, S. D. | Author | ||
| Year | 2019 (August) | Volume | 25 |
| Publisher | Cambridge University Press (CUP) | ||
| DOI | doi:10.1017/s1431927619001119Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 4885697 | Long-form Identifier | mindat:1:5:4885697:3 |
| GUID | 0 | ||
| Full Reference | Brown, H. G., Chen, Z., Weyland, M., Ophus, C., Ciston, J., Allen, L. J., Findlay, S. D. (2019) Structure Retrieval of Strongly Scattering Materials in the Transmission Electron Microscope. Microscopy and Microanalysis, 25. 76-77 doi:10.1017/s1431927619001119 | ||
| Plain Text | Brown, H. G., Chen, Z., Weyland, M., Ophus, C., Ciston, J., Allen, L. J., Findlay, S. D. (2019) Structure Retrieval of Strongly Scattering Materials in the Transmission Electron Microscope. Microscopy and Microanalysis, 25. 76-77 doi:10.1017/s1431927619001119 | ||
| In | (2019) Microscopy and Microanalysis Vol. 25. Cambridge University Press (CUP) | ||
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