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Caplins, Benjamin W., White, Ryan M., Holm, Jason D., Keller, Robert R. (2019) A Workflow for Imaging 2D Materials using 4D STEM-in-SEM. Microscopy and Microanalysis, 25. 218-219 doi:10.1017/s143192761900182x

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Reference TypeJournal (article/letter/editorial)
TitleA Workflow for Imaging 2D Materials using 4D STEM-in-SEM
JournalMicroscopy and Microanalysis
AuthorsCaplins, Benjamin W.Author
White, Ryan M.Author
Holm, Jason D.Author
Keller, Robert R.Author
Year2019 (August)Volume25
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s143192761900182xSearch in ResearchGate
Generate Citation Formats
Mindat Ref. ID4885855Long-form Identifiermindat:1:5:4885855:5
GUID0
Full ReferenceCaplins, Benjamin W., White, Ryan M., Holm, Jason D., Keller, Robert R. (2019) A Workflow for Imaging 2D Materials using 4D STEM-in-SEM. Microscopy and Microanalysis, 25. 218-219 doi:10.1017/s143192761900182x
Plain TextCaplins, Benjamin W., White, Ryan M., Holm, Jason D., Keller, Robert R. (2019) A Workflow for Imaging 2D Materials using 4D STEM-in-SEM. Microscopy and Microanalysis, 25. 218-219 doi:10.1017/s143192761900182x
In(2019) Microscopy and Microanalysis Vol. 25. Cambridge University Press (CUP)

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Caplins, Benjamin W., Holm, Jason D., White, Ryan M., Keller, Robert R. (2020) Orientation mapping of graphene using 4D STEM-in-SEM. Ultramicroscopy, 219. 113137pp. doi:10.1016/j.ultramic.2020.113137
Caplins, Benjamin W., Holm, Jason D., Keller, Robert R. (2018) Developing a Programmable STEM Detector for the Scanning Electron Microscope. Microscopy and Microanalysis, 24. 658-659 doi:10.1017/s1431927618003781
Caplins, Benjamin W., Holm, Jason D., Keller, Robert R. (2019) Transmission imaging with a programmable detector in a scanning electron microscope. Ultramicroscopy, 196. 40-48 doi:10.1016/j.ultramic.2018.09.006
Holm, Jason, Keller, Robert R. (2017) Acceptance Angle Control for Improved Transmission Imaging in an SEM. Microscopy Today, 25 (2). 12-19 doi:10.1017/s1551929516001267
Holm, Jason, White, Ryan (2017) On Mass-Thickness Contrast in Annular Dark-Field STEM-in-SEM Images. Microscopy and Microanalysis, 23. 600-601 doi:10.1017/s1431927617003683
Holm, Jason, Mansfield, Elisabeth (2021) A 4D STEM-in-SEM Analysis of Hexagonal Boron Nitride. Microscopy and Microanalysis, 27. 1824-1825 doi:10.1017/s143192762100667x
Caplins, Benjamin W., Holm, Jason D., Keller, Robert R. (2019) Orientation mapping of graphene in a scanning electron microscope. Carbon, 149. 400-406 doi:10.1016/j.carbon.2019.04.042
Holm, Jason (2017) Analytical STEM-in-SEM: Towards Rigorous Quantitative Imaging. Microscopy and Microanalysis, 23. 558-559 doi:10.1017/s1431927617003476
Holm, Jason (2021) STEM-in-SEM Imaging and Diffraction with Extremely Beam Sensitive Ultrathin Zeolites. Microscopy and Microanalysis, 27. 1584-1585 doi:10.1017/s1431927621005833
Bammes, Benjamin, Ramachandra, Ranjan, Mackey, Mason R., Bilhorn, Robert, Ellisman, Mark (2019) Multi-Color Electron Microscopy of Cellular Ultrastructure Using 4D-STEM. Microscopy and Microanalysis, 25. 1060-1061 doi:10.1017/s1431927619006032
Holm, Jason, Keller, Robert (2015) Analytical Transmission Scanning Electron Microscopy: Extending the Capabilities of a Conventional SEM Using an Off-the-Shelf Transmission Detector. Microscopy and Microanalysis, 21. 1867-1868 doi:10.1017/s1431927615010119
 
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