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Strüder, Lothar, Soltau, Heike, Niculae, Adrian, Aschauer, Stefan, Hartmann, Robert, Davis, Jeff (2019) Detection of Low Energy X-rays with High Efficiency and Spectral Resolution. Microscopy and Microanalysis, 25. 272-273 doi:10.1017/s1431927619002095

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Reference TypeJournal (article/letter/editorial)
TitleDetection of Low Energy X-rays with High Efficiency and Spectral Resolution
JournalMicroscopy and Microanalysis
AuthorsStrüder, LotharAuthor
Soltau, HeikeAuthor
Niculae, AdrianAuthor
Aschauer, StefanAuthor
Hartmann, RobertAuthor
Davis, JeffAuthor
Year2019 (August)Volume25
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927619002095Search in ResearchGate
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Mindat Ref. ID4885916Long-form Identifiermindat:1:5:4885916:5
GUID0
Full ReferenceStrüder, Lothar, Soltau, Heike, Niculae, Adrian, Aschauer, Stefan, Hartmann, Robert, Davis, Jeff (2019) Detection of Low Energy X-rays with High Efficiency and Spectral Resolution. Microscopy and Microanalysis, 25. 272-273 doi:10.1017/s1431927619002095
Plain TextStrüder, Lothar, Soltau, Heike, Niculae, Adrian, Aschauer, Stefan, Hartmann, Robert, Davis, Jeff (2019) Detection of Low Energy X-rays with High Efficiency and Spectral Resolution. Microscopy and Microanalysis, 25. 272-273 doi:10.1017/s1431927619002095
In(2019) Microscopy and Microanalysis Vol. 25. Cambridge University Press (CUP)

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Struder, Lothar, Soltau, Heike, Holl, Peter, Hartmann, Robert, Schlosser, Dieter, Niculae, Adrian, Huth, Martin, Davis, Jeff (2018) X-ray Detectors - in Heaven and on Earth. Microscopy and Microanalysis, 24. 990-991 doi:10.1017/s1431927618005445
Niculae, Adrian, Barros, Thiago, Bechteler, Alois, Lackner, Robert, Hermenau, Kathrin, Heizinger, Klaus, Mönninghoff, Tristan, Soltau, Heike, Strüder, Lothar (2019) News on Silicon Drift Detectors for High Resolution EDX Imaging and Spectroscopy. Microscopy and Microanalysis, 25. 516-517 doi:10.1017/s1431927619003313
Davis, Jeffrey M., Schmidt, Julia, Huth, Martin, Hartmann, Robert, Soltau, Heike, Strüder, Lothar (2018) Micro-Focused Five Dimensional X-ray Imaging with the Color X-ray Camera. Microscopy and Microanalysis, 24. 986-987 doi:10.1017/s1431927618005421
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Davis, Jeffrey M., Schmidt, Julia, Huth, Martin, Hartmann, Robert, Ihle, Sebastian, Steigenhöfer, Daniel, Soltau, Heike, Strüder, Lothar (2016) Analysis of Polymorphs Using Simultaneous X-ray Fluorescence and Diffraction with an Imaging Spectrometer. Microscopy and Microanalysis, 22. 102-103 doi:10.1017/s1431927616001367
Davis, Jeffrey M., Schmidt, Julia, Huth, Martin, Hartmann, Robert, Soltau, Heike, Strüder, Lothar (2018) A New Approach: Quantitative Imaging Spectrometry for Iron Oxide Analysis. Microscopy and Microanalysis, 24. 784-785 doi:10.1017/s1431927618004415
Huth, Martin, Eckert, Björn, Majewski, Petra, Aschauer, Stefan, Strüder, Lothar, Soltau, Heike (2024) 4D STEM in SEM with a Fast Pixelated Direct Detector. Microscopy and Microanalysis, 30. doi:10.1093/mam/ozae044.316
Strüder, Lothar, Niculae, Adrian, Holl, Peter, Soltau, Heike (2020) Development of the Silicon Drift Detector for Electron Microscopy Applications. Microscopy Today, 28 (5) 46-53 doi:10.1017/s1551929520001327
Strüder, Lothar, Davis, Jeffrey M., Hartman, Robert, Holl, Peter, Ihle, Sebastian, Kalok, David, Soltau, Heike (2017) Spatial Resolution Smaller Than the Pixel Size? Yes we can!. Microscopy and Microanalysis, 23. 90-91 doi:10.1017/s1431927617001131
Davis, Jeffrey M., Schmidt, Julia, Huth, Martin, Hartman, Robert, Soltau, Heike, Strüder, Lothar (2017) Processing a Five Dimensional X-ray Image: Big Data Challenges and Opportunities. Microscopy and Microanalysis, 23. 200-201 doi:10.1017/s1431927617001684
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