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Day, A.C., Francois-Saint-Cyr, H., Geiser, B.P, Payne, T., Oltman, E., Ringer, S.P., Reinhard, D.A. (2019) Recent Developments in APT Analysis Automation and Support for User-Defined Custom Analysis Procedures in IVAS 4. Microscopy and Microanalysis, 25. 338-339 doi:10.1017/s1431927619002423

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Reference TypeJournal (article/letter/editorial)
TitleRecent Developments in APT Analysis Automation and Support for User-Defined Custom Analysis Procedures in IVAS 4
JournalMicroscopy and Microanalysis
AuthorsDay, A.C.Author
Francois-Saint-Cyr, H.Author
Geiser, B.PAuthor
Payne, T.Author
Oltman, E.Author
Ringer, S.P.Author
Reinhard, D.A.Author
Year2019 (August)Volume25
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927619002423Search in ResearchGate
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Mindat Ref. ID4885989Long-form Identifiermindat:1:5:4885989:1
GUID0
Full ReferenceDay, A.C., Francois-Saint-Cyr, H., Geiser, B.P, Payne, T., Oltman, E., Ringer, S.P., Reinhard, D.A. (2019) Recent Developments in APT Analysis Automation and Support for User-Defined Custom Analysis Procedures in IVAS 4. Microscopy and Microanalysis, 25. 338-339 doi:10.1017/s1431927619002423
Plain TextDay, A.C., Francois-Saint-Cyr, H., Geiser, B.P, Payne, T., Oltman, E., Ringer, S.P., Reinhard, D.A. (2019) Recent Developments in APT Analysis Automation and Support for User-Defined Custom Analysis Procedures in IVAS 4. Microscopy and Microanalysis, 25. 338-339 doi:10.1017/s1431927619002423
In(2019) Microscopy and Microanalysis Vol. 25. Cambridge University Press (CUP)

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Reinhard, D.A., Payne, T.R., Strennen, E.M., Oltman, E., Geiser, B.P., Sobering, G.S., Mandt, J. (2019) Improved Data Analysis with IVAS 4 and AP Suite. Microscopy and Microanalysis, 25. 302-303 doi:10.1017/s1431927619002241
Reinhard, D.A., Payne, T.R., Strennen, E.M., Oltman, E., Geiser, B.P., Sobering, G.S., Lenz, D.R., Mandt, J., Groth, G.A., Larson, D.J., Ulfig, R.M., Prosa, T.J. (2019) Atom Probe Tomography Productivity Enhancements. Microscopy and Microanalysis, 25. 522-523 doi:10.1017/s1431927619003349
Geiser, Brian P., Vurpillot, Francois, Chen, Yimeng, Rice, Katherine P., Wright, Stuart, Reinhard, David A., Sobering, Geoff, Ulfig, Robert M., Larson, David J. (2017) Recent Reconstruction Developments in IVAS. Microscopy and Microanalysis, 23. 638-639 doi:10.1017/s1431927617003853
Larson, D.J., Prosa, T.J., Oltman, E., Reinhard, D.A., Geiser, B.P., Ulfig, R.M., Merkulov, A. (2018) A High Multiple Hits Correction Factor for Atom Probe Tomography. Microscopy and Microanalysis, 24. 1084-1085 doi:10.1017/s1431927618005901
Day, A.C., Ceguerra, A. V., Ringer, S.P. (2019) Improving Spatial Accuracy in Atom Probe Tomography through a Crystallography-Mediated Reconstruction (CMR). Microscopy and Microanalysis, 25. 292-293 doi:10.1017/s1431927619002198
Geiser, BP, Reinhard, DA, Bunton, JH, Payne, TR, Rice, KP, Chen, Y, Larson, DJ (2019) Reconstruction Metrics in Atom Probe Tomography. Microscopy and Microanalysis, 25. 336-337 doi:10.1017/s1431927619002411
Ulfig, R.M., Geiser, B.P., Prosa, T.J., Larson, D.J., Leroux, J., Dupont, B. (2013) Multi-Region Data Simulation for Detection Limit Investigations in IVASâ„¢. Microscopy and Microanalysis, 19. 986-987 doi:10.1017/s1431927613006922
Antonov, Stoichko, Day, Alec, Francois Saint Cyr, Hugues, Lu, Song, Li, Wendao, Feng, Qiang (2019) Atom Probe Tomography Investigation on the Effect of Ni Additions on the Site Occupation and Partitioning Behavior in Co-Based Superalloys. Microscopy and Microanalysis, 25. 2546-2547 doi:10.1017/s1431927619013461
Reinhard, David, Payne, Tim, Strennen, Eric, Geiser, Brian, Groth, Gard, Lenz, Dan (2020) Increased LEAP Utilization Through Automation of Multi-specimen Alignment and Acquisition. Microscopy and Microanalysis, 26. 2616 doi:10.1017/s1431927620022199
Payne, James E, Reinhard, David A., Payne, Tim R., Strennen, Eric, Geiser, Brian P. (2022) AP Suite Extension Infrastructure. Microscopy and Microanalysis, 28. 730-731 doi:10.1017/s1431927622003385
Ulfig, RM, Prosa, TJ, Reinhard, DA, Oltman, E, Alvis, RA (2008) Towards Quantitative Analysis of Nitrogen in Microelectronics Applications for Atom Probe Tomography. Microscopy and Microanalysis, 14. 1230-1231 doi:10.1017/s1431927608088302
 
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