Tian, Xuezeng, Kim, Dennis S., Yang, Shize, Ciccarino, Christopher J., Gong, Yongji, Yang, Yongsoo, Yang, Yao, Duschatko, Blake, Yuan, Yakun, Ajayan, Pulickel M., Idrobo, Juan-Carlos, Narang, Prineha, Miao, Jianwei (2019) Determining the 3D Atomic Coordinates and Crystal Defects in 2D Materials with Picometer Precision. Microscopy and Microanalysis, 25. 404-405 doi:10.1017/s1431927619002757
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Determining the 3D Atomic Coordinates and Crystal Defects in 2D Materials with Picometer Precision | ||
| Journal | Microscopy and Microanalysis | ||
| Authors | Tian, Xuezeng | Author | |
| Kim, Dennis S. | Author | ||
| Yang, Shize | Author | ||
| Ciccarino, Christopher J. | Author | ||
| Gong, Yongji | Author | ||
| Yang, Yongsoo | Author | ||
| Yang, Yao | Author | ||
| Duschatko, Blake | Author | ||
| Yuan, Yakun | Author | ||
| Ajayan, Pulickel M. | Author | ||
| Idrobo, Juan-Carlos | Author | ||
| Narang, Prineha | Author | ||
| Miao, Jianwei | Author | ||
| Year | 2019 (August) | Volume | 25 |
| Publisher | Cambridge University Press (CUP) | ||
| DOI | doi:10.1017/s1431927619002757Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 4886063 | Long-form Identifier | mindat:1:5:4886063:9 |
| GUID | 0 | ||
| Full Reference | Tian, Xuezeng, Kim, Dennis S., Yang, Shize, Ciccarino, Christopher J., Gong, Yongji, Yang, Yongsoo, Yang, Yao, Duschatko, Blake, Yuan, Yakun, Ajayan, Pulickel M., Idrobo, Juan-Carlos, Narang, Prineha, Miao, Jianwei (2019) Determining the 3D Atomic Coordinates and Crystal Defects in 2D Materials with Picometer Precision. Microscopy and Microanalysis, 25. 404-405 doi:10.1017/s1431927619002757 | ||
| Plain Text | Tian, Xuezeng, Kim, Dennis S., Yang, Shize, Ciccarino, Christopher J., Gong, Yongji, Yang, Yongsoo, Yang, Yao, Duschatko, Blake, Yuan, Yakun, Ajayan, Pulickel M., Idrobo, Juan-Carlos, Narang, Prineha, Miao, Jianwei (2019) Determining the 3D Atomic Coordinates and Crystal Defects in 2D Materials with Picometer Precision. Microscopy and Microanalysis, 25. 404-405 doi:10.1017/s1431927619002757 | ||
| In | (2019) Microscopy and Microanalysis Vol. 25. Cambridge University Press (CUP) | ||
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