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Peronio, Angelo, Okabayashi, Norio, Griesbeck, Florian, Giessibl, Franz (2019) Radio frequency filter for an enhanced resolution of inelastic electron tunneling spectroscopy in a combined scanning tunneling- and atomic force microscope. Review of Scientific Instruments, 90 (12). 123104pp. doi:10.1063/1.5119888

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Reference TypeJournal (article/letter/editorial)
TitleRadio frequency filter for an enhanced resolution of inelastic electron tunneling spectroscopy in a combined scanning tunneling- and atomic force microscope
JournalReview of Scientific Instruments
AuthorsPeronio, AngeloAuthor
Okabayashi, NorioAuthor
Griesbeck, FlorianAuthor
Giessibl, FranzAuthor
Year2019 (December 1)Volume90
Issue12
PublisherAIP Publishing
DOIdoi:10.1063/1.5119888Search in ResearchGate
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Mindat Ref. ID4942003Long-form Identifiermindat:1:5:4942003:0
GUID0
Full ReferencePeronio, Angelo, Okabayashi, Norio, Griesbeck, Florian, Giessibl, Franz (2019) Radio frequency filter for an enhanced resolution of inelastic electron tunneling spectroscopy in a combined scanning tunneling- and atomic force microscope. Review of Scientific Instruments, 90 (12). 123104pp. doi:10.1063/1.5119888
Plain TextPeronio, Angelo, Okabayashi, Norio, Griesbeck, Florian, Giessibl, Franz (2019) Radio frequency filter for an enhanced resolution of inelastic electron tunneling spectroscopy in a combined scanning tunneling- and atomic force microscope. Review of Scientific Instruments, 90 (12). 123104pp. doi:10.1063/1.5119888
In(2019, December) Review of Scientific Instruments Vol. 90 (12) AIP Publishing

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Okabayashi, Norio, Gustafsson, Alexander, Peronio, Angelo, Paulsson, Magnus, Arai, Toyoko, Giessibl, Franz J. (2016) Influence of atomic tip structure on the intensity of inelastic tunneling spectroscopy data analyzed by combined scanning tunneling spectroscopy, force microscopy, and density functional theory. Physical Review B, 93 (16) doi:10.1103/physrevb.93.165415
PĂĽrckhauer, Korbinian, Maier, Simon, Merkel, Anja, Kirpal, Dominik, Giessibl, Franz J. (2020) Combined atomic force microscope and scanning tunneling microscope with high optical access achieving atomic resolution in ambient conditions. Review of Scientific Instruments, 91 (8) 83701pp. doi:10.1063/5.0013921
Peronio, Angelo, Giessibl, Franz J. (2016) Attempts to test an alternative electrodynamic theory of superconductors by low-temperature scanning tunneling and atomic force microscopy. Physical Review B, 94 (9) doi:10.1103/physrevb.94.094503
Giessibl, Franz J. (2019) The qPlus sensor, a powerful core for the atomic force microscope. Review of Scientific Instruments, 90 (1). 11101pp. doi:10.1063/1.5052264
Okabayashi, Norio, Komeda, Tadahiro (2009) Inelastic electron tunneling spectroscopy with a dilution refrigerator based scanning tunneling microscope. Measurement Science and Technology, 20. 95602pp. doi:10.1088/0957-0233/20/9/095602
Okabayashi, Norio, Peronio, Angelo, Paulsson, Magnus, Arai, Toyoko, Giessibl, Franz J. (2018) Vibrations of a molecule in an external force field. Proceedings of the National Academy of Sciences, 115 (18) 4571-4576 doi:10.1073/pnas.1721498115
Giessibl, F. J., Trafas, B. M. (1994) Piezoresistive cantilevers utilized for scanning tunneling and scanning force microscope in ultrahigh vacuum. Review of Scientific Instruments, 65 (6). 1923-1929 doi:10.1063/1.1145232
Okabayashi, Norio, Konda, Youhei, Komeda, Tadahiro (2008) Inelastic Electron Tunneling Spectroscopy of an Alkanethiol Self-Assembled Monolayer Using Scanning Tunneling Microscopy. Physical Review Letters, 100 (21). doi:10.1103/physrevlett.100.217801
Friedlein, J., Harm, J., Lindner, P., Bargsten, L., Bazarnik, M., Krause, S., Wiesendanger, R. (2019) A radio-frequency spin-polarized scanning tunneling microscope. Review of Scientific Instruments, 90 (12). 123705pp. doi:10.1063/1.5104317
Zhang, Shuai, Huang, Di, Wu, Shiwei (2016) A cryogen-free low temperature scanning tunneling microscope capable of inelastic electron tunneling spectroscopy. Review of Scientific Instruments, 87 (6). 63701pp. doi:10.1063/1.4952577
Oral, A., Grimble, R. A., Ă–zer, H. Ă–., Pethica, J. B. (2003) High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (nc AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy. Review of Scientific Instruments, 74 (8). 3656-3663 doi:10.1063/1.1593786
 
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