Stephenson, J. D. (1998) White Synchrotron Radiation Tomography of fs-Excimer Laser Ablation/Bulk Damage in a (100) Si Wafer. physica status solidi (a), 165 (1). doi:10.1002/(sici)1521-396x(199801)165:13.0.co;2-v
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | White Synchrotron Radiation Tomography of fs-Excimer Laser Ablation/Bulk Damage in a (100) Si Wafer | ||
| Journal | physica status solidi (a) | ||
| Authors | Stephenson, J. D. | Author | |
| Year | 1998 (January) | Volume | 165 |
| Issue | 1 | ||
| Publisher | Wiley | ||
| DOI | doi:10.1002/(sici)1521-396x(199801)165:1 | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 5083282 | Long-form Identifier | mindat:1:5:5083282:4 |
| GUID | 0 | ||
| Full Reference | Stephenson, J. D. (1998) White Synchrotron Radiation Tomography of fs-Excimer Laser Ablation/Bulk Damage in a (100) Si Wafer. physica status solidi (a), 165 (1). doi:10.1002/(sici)1521-396x(199801)165:1 | ||
| Plain Text | Stephenson, J. D. (1998) White Synchrotron Radiation Tomography of fs-Excimer Laser Ablation/Bulk Damage in a (100) Si Wafer. physica status solidi (a), 165 (1). doi:10.1002/(sici)1521-396x(199801)165:13.0.co;2-v | ||
| In | (1998, January) physica status solidi (a) Vol. 165 (1) Wiley | ||
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