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Kaneko, M., Hashizume, T., Odnoblyudov, V. A., Tu, C. W. (2007) Electrical and deep-level characterization of GaP1−xNx grown by gas-source molecular beam epitaxy. Journal of Applied Physics, 101 (10). 103707pp. doi:10.1063/1.2732451

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Reference TypeJournal (article/letter/editorial)
TitleElectrical and deep-level characterization of GaP1−xNx grown by gas-source molecular beam epitaxy
JournalJournal of Applied Physics
AuthorsKaneko, M.Author
Hashizume, T.Author
Odnoblyudov, V. A.Author
Tu, C. W.Author
Year2007 (May 15)Volume101
Issue10
PublisherAIP Publishing
DOIdoi:10.1063/1.2732451Search in ResearchGate
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Mindat Ref. ID5145331Long-form Identifiermindat:1:5:5145331:4
GUID0
Full ReferenceKaneko, M., Hashizume, T., Odnoblyudov, V. A., Tu, C. W. (2007) Electrical and deep-level characterization of GaP1−xNx grown by gas-source molecular beam epitaxy. Journal of Applied Physics, 101 (10). 103707pp. doi:10.1063/1.2732451
Plain TextKaneko, M., Hashizume, T., Odnoblyudov, V. A., Tu, C. W. (2007) Electrical and deep-level characterization of GaP1−xNx grown by gas-source molecular beam epitaxy. Journal of Applied Physics, 101 (10). 103707pp. doi:10.1063/1.2732451
In(2007, May) Journal of Applied Physics Vol. 101 (10) AIP Publishing


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