| Reference Type | Journal (article/letter/editorial) |
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| Title | Infrared total internal reflection spectroscopy of dimethylcadmium on chemically passivated silicon surfaces |
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| Journal | Chemical Physics Letters |
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| Authors | Sanchez, Esaul | Author |
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| Shaw, Ping S. | Author |
| O'neill, James A. | Author |
| Osgood, Richard M. | Author |
| Year | 1988 (June) | Volume | 147 |
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| Publisher | Elsevier BV |
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| DOI | doi:10.1016/0009-2614(88)85075-9Search in ResearchGate |
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| Generate Citation Formats |
| Mindat Ref. ID | 5882891 | Long-form Identifier | mindat:1:5:5882891:5 |
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| GUID | 0 |
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| Full Reference | Sanchez, Esaul, Shaw, Ping S., O'neill, James A., Osgood, Richard M. (1988) Infrared total internal reflection spectroscopy of dimethylcadmium on chemically passivated silicon surfaces. Chemical Physics Letters, 147. 153-160 doi:10.1016/0009-2614(88)85075-9 |
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| Plain Text | Sanchez, Esaul, Shaw, Ping S., O'neill, James A., Osgood, Richard M. (1988) Infrared total internal reflection spectroscopy of dimethylcadmium on chemically passivated silicon surfaces. Chemical Physics Letters, 147. 153-160 doi:10.1016/0009-2614(88)85075-9 |
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| In | (n.d.) Chemical Physics Letters Vol. 147. Elsevier BV |
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