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Frątczak, E.Z., Uznański, P., Moneta, M.E. (2015) Characterization of molecular organization in pentacene thin films on SiO2 surface using infrared spectroscopy, spectroscopic ellipsometry, and atomic force microscopy. Chemical Physics, 456. 49-56 doi:10.1016/j.chemphys.2015.04.015

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Reference TypeJournal (article/letter/editorial)
TitleCharacterization of molecular organization in pentacene thin films on SiO2 surface using infrared spectroscopy, spectroscopic ellipsometry, and atomic force microscopy
JournalChemical Physics
AuthorsFrątczak, E.Z.Author
Uznański, P.Author
Moneta, M.E.Author
Year2015 (July)Volume456
PublisherElsevier BV
DOIdoi:10.1016/j.chemphys.2015.04.015Search in ResearchGate
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Mindat Ref. ID5963985Long-form Identifiermindat:1:5:5963985:9
GUID0
Full ReferenceFrątczak, E.Z., Uznański, P., Moneta, M.E. (2015) Characterization of molecular organization in pentacene thin films on SiO2 surface using infrared spectroscopy, spectroscopic ellipsometry, and atomic force microscopy. Chemical Physics, 456. 49-56 doi:10.1016/j.chemphys.2015.04.015
Plain TextFrątczak, E.Z., Uznański, P., Moneta, M.E. (2015) Characterization of molecular organization in pentacene thin films on SiO2 surface using infrared spectroscopy, spectroscopic ellipsometry, and atomic force microscopy. Chemical Physics, 456. 49-56 doi:10.1016/j.chemphys.2015.04.015
In(n.d.) Chemical Physics Vol. 456. Elsevier BV

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