Argunova, T. S., Zabrodskii, A. G., Sorokin, L. M., Abrosimov, N. V., Je, J. H. (2011) X-ray imaging of structural defects in Si1−x Ge x single crystals using a white synchrotron beam. Crystallography Reports, 56 (5) 811-818 doi:10.1134/s1063774511050038
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | X-ray imaging of structural defects in Si1−x Ge x single crystals using a white synchrotron beam | ||
| Journal | Crystallography Reports | ||
| Authors | Argunova, T. S. | Author | |
| Zabrodskii, A. G. | Author | ||
| Sorokin, L. M. | Author | ||
| Abrosimov, N. V. | Author | ||
| Je, J. H. | Author | ||
| Year | 2011 (September) | Volume | 56 |
| Issue | 5 | ||
| Publisher | Pleiades Publishing Ltd | ||
| DOI | doi:10.1134/s1063774511050038Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 620646 | Long-form Identifier | mindat:1:5:620646:2 |
| GUID | 0 | ||
| Full Reference | Argunova, T. S., Zabrodskii, A. G., Sorokin, L. M., Abrosimov, N. V., Je, J. H. (2011) X-ray imaging of structural defects in Si1−x Ge x single crystals using a white synchrotron beam. Crystallography Reports, 56 (5) 811-818 doi:10.1134/s1063774511050038 | ||
| Plain Text | Argunova, T. S., Zabrodskii, A. G., Sorokin, L. M., Abrosimov, N. V., Je, J. H. (2011) X-ray imaging of structural defects in Si1−x Ge x single crystals using a white synchrotron beam. Crystallography Reports, 56 (5) 811-818 doi:10.1134/s1063774511050038 | ||
| In | (2011, September) Crystallography Reports Vol. 56 (5) Pleiades Publishing Ltd | ||
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