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Ishitani, Tohru, Ohya, Kaoru (2006) Comparison in spatial spreads of secondary electron information between scanning ion and scanning electron microscopy. Scanning, 25 (4). 201-209 doi:10.1002/sca.4950250407

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Reference TypeJournal (article/letter/editorial)
TitleComparison in spatial spreads of secondary electron information between scanning ion and scanning electron microscopy
JournalScanning
AuthorsIshitani, TohruAuthor
Ohya, KaoruAuthor
Year2006 (December 6)Volume25
Issue4
PublisherWiley
DOIdoi:10.1002/sca.4950250407Search in ResearchGate
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Mindat Ref. ID6445840Long-form Identifiermindat:1:5:6445840:7
GUID0
Full ReferenceIshitani, Tohru, Ohya, Kaoru (2006) Comparison in spatial spreads of secondary electron information between scanning ion and scanning electron microscopy. Scanning, 25 (4). 201-209 doi:10.1002/sca.4950250407
Plain TextIshitani, Tohru, Ohya, Kaoru (2006) Comparison in spatial spreads of secondary electron information between scanning ion and scanning electron microscopy. Scanning, 25 (4). 201-209 doi:10.1002/sca.4950250407
In(2006, December) Scanning Vol. 25 (4) Wiley

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Ishitani, Tohru, Tsuboi, Hideki (2006) Objective comparison of scanning ion and scanning electron microscope images. Scanning, 19 (7). 489-497 doi:10.1002/sca.4950190707
Ishitani, Tohru, Ohya, Kaoru (2004) Comparative Study of Scanning Ion Microscope and Scanning Electron Microscope Images Using Monte Carlo Simulations. Microscopy and Microanalysis, 10. 140-141 doi:10.1017/s1431927604880462
Ishitani, Tohru, Sato, Mitsugu (2006) A method for personal expertise-independent evaluation of image resolution in scanning electron microscopy. Scanning, 24 (4). 191-203 doi:10.1002/sca.4950240406
Ohya, Kaoru (2019) Channeling Contrast Simulation of Secondary Electron Images in Scanning Ion Microscopes. Microscopy and Microanalysis, 25. 924-925 doi:10.1017/s143192761900535x
Jacka, M., Zadrazil, M., Lopour, F. (2006) A differentially pumped secondary electron detector for low-vacuum scanning electron microscopy. Scanning, 25 (5). 243-246 doi:10.1002/sca.4950250505
Mil'shteinand, S., Joy, D. C. (2006) Microanalysis using secondary electrons in scanning electron microscopy. Scanning, 23 (5). 295-297 doi:10.1002/sca.4950230501
Cazaux, Jacques (2006) Charging in scanning electron microscopy “from inside and outside”. Scanning, 26 (4). 181-203 doi:10.1002/sca.4950260406
Wight, Scott, Gillen, Greg, Herne, Tonya (2006) Development of environmental scanning electron microscopy electron beam profile imaging with self-assembled monolayers and secondary ion mass spectroscopy. Scanning, 19 (2). 71-74 doi:10.1002/sca.4950190202
Griffin, Brendan J. (2011) A comparison of conventional Everhart-Thornley style and in-lens secondary electron detectors-a further variable in scanning electron microscopy. Scanning, 33 (3). 162-173 doi:10.1002/sca.20255
Peters, Klaus-Ruediger, Wergin, William P. (2006) Differential contrast imaging of secondary electron signals in cryo-field-emission scanning electron microscopy. Scanning, 19 (6). 396-402 doi:10.1002/sca.4950190602
Baba-Kishi, K. Z. (2006) Scanning reflection electron microscopy of surface topography by diffusely scattered electrons in the scanning electron microscope. Scanning, 18 (4). 315-321 doi:10.1002/sca.1996.4950180408
 
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