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Prasad, M. Satya, Joy, D. C. (2006) Measurements of absolute X-ray generation efficiency for selected K, L, and M-lines. Scanning, 25 (4). 210-215 doi:10.1002/sca.4950250408

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Reference TypeJournal (article/letter/editorial)
TitleMeasurements of absolute X-ray generation efficiency for selected K, L, and M-lines
JournalScanning
AuthorsPrasad, M. SatyaAuthor
Joy, D. C.Author
Year2006 (December 6)Volume25
Issue4
PublisherWiley
DOIdoi:10.1002/sca.4950250408Search in ResearchGate
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Mindat Ref. ID6445841Long-form Identifiermindat:1:5:6445841:6
GUID0
Full ReferencePrasad, M. Satya, Joy, D. C. (2006) Measurements of absolute X-ray generation efficiency for selected K, L, and M-lines. Scanning, 25 (4). 210-215 doi:10.1002/sca.4950250408
Plain TextPrasad, M. Satya, Joy, D. C. (2006) Measurements of absolute X-ray generation efficiency for selected K, L, and M-lines. Scanning, 25 (4). 210-215 doi:10.1002/sca.4950250408
In(2006, December) Scanning Vol. 25 (4) Wiley

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Prasad, M.Satya, Joy, D. C. (2002) Measurements of Absolute X-ray Generation Efficiency. Microscopy and Microanalysis, 8. 1486-1487 doi:10.1017/s1431927602104065
Tang, Xiaohu, Joy, David C. (2006) Quantitative measurements of charging in a gaseous environment. Scanning, 25 (4). 194-200 doi:10.1002/sca.4950250406
Lorusso, G. F., Joy, D. C. (2006) Experimental resolution measurement in critical dimension scanning electron microscope metrology. Scanning, 25 (4). 175-180 doi:10.1002/sca.4950250403
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Farrow, R. C., Joy, D. C. (1979) Measurements of electron channeling pattern linewidths in silicon. Scanning, 2 (4). 249-254 doi:10.1002/sca.4950020407
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He, Jing, Joy, David C. (2006) Measurement of total gas scattering cross-section. Scanning, 25 (6). 285-290 doi:10.1002/sca.4950250603
Mil'shteinand, S., Joy, D. C. (2006) Microanalysis using secondary electrons in scanning electron microscopy. Scanning, 23 (5). 295-297 doi:10.1002/sca.4950230501
Hwu, J. J., Joy, D. C. (2006) A study of electron beam-induced conductivity in resists. Scanning, 21 (4). 264-272 doi:10.1002/sca.4950210406
Williams, Thomas J. (2006) Scanning electron microscopy and x-ray microanalysis, 3rd edition. By Joseph Goldstein, Dale Newbury, David Joy, Charles Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, Joseph Michael Kluwer Academic Publishers, New York (2003) ISBN 0306472929; hardbac. Scanning, 27 (4). 215-216 doi:10.1002/sca.4950270410
 
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