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Vam, L. Pham, Gautier, M., Duraud, J. P., Gillet, F., Jollet, F. (1990) An XPS, EELS and LEED study of monocrystalline Al2O3 (0001) surfaces: Modifications induced by heat treatment or ion bombardment. Surface and Interface Analysis, 16 (1). 214-215 doi:10.1002/sia.740160143

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Reference TypeJournal (article/letter/editorial)
TitleAn XPS, EELS and LEED study of monocrystalline Al2O3 (0001) surfaces: Modifications induced by heat treatment or ion bombardment
JournalSurface and Interface Analysis
AuthorsVam, L. PhamAuthor
Gautier, M.Author
Duraud, J. P.Author
Gillet, F.Author
Jollet, F.Author
Year1990 (July)Volume16
Issue1
PublisherWiley
DOIdoi:10.1002/sia.740160143Search in ResearchGate
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Mindat Ref. ID6502829Long-form Identifiermindat:1:5:6502829:4
GUID0
Full ReferenceVam, L. Pham, Gautier, M., Duraud, J. P., Gillet, F., Jollet, F. (1990) An XPS, EELS and LEED study of monocrystalline Al2O3 (0001) surfaces: Modifications induced by heat treatment or ion bombardment. Surface and Interface Analysis, 16 (1). 214-215 doi:10.1002/sia.740160143
Plain TextVam, L. Pham, Gautier, M., Duraud, J. P., Gillet, F., Jollet, F. (1990) An XPS, EELS and LEED study of monocrystalline Al2O3 (0001) surfaces: Modifications induced by heat treatment or ion bombardment. Surface and Interface Analysis, 16 (1). 214-215 doi:10.1002/sia.740160143
In(1990, July) Surface and Interface Analysis Vol. 16 (1) Wiley

See Also

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Gautier, M., Duraud, J.P., Pham Van, L., Guittet, M.J. (1991) Modifications of α-Al2O3(0001) surfaces induced by thermal treatments or ion bombardment. Surface Science Letters, 250 (1). doi:10.1016/0167-2584(91)90564-8
Gautier, M., Duraud, J.P., Pham Van, L., Guittet, M.J. (1991) Modifications of α-Al2O3(0001) surfaces induced by thermal treatments or ion bombardment. Surface Science, 250 (1). 71-80 doi:10.1016/0039-6028(91)90710-a
Thromat, N., Gautier, M., Jollet, F., Duraud, J. P., Le Gressus, C. (1990) Surface composition and chemical bonding of thermally reduced yttria as studied by XPS and SEXAFS: Influence of Zr doping. Surface and Interface Analysis, 15 (6). 355-363 doi:10.1002/sia.740150603
Valeri, S., Lolli, M. (1990) AES, EELS and XPS study of ion-induced GaAs and InP(110) surface and subsurface modifications. Surface and Interface Analysis, 16 (1). 59-64 doi:10.1002/sia.740160115
BART, F., GAUTIER, M., JOLLET, F., DURAUD, J. P. (1994) (0001) quartz surface imperfections. Le Journal de Physique IV, 4. doi:10.1051/jp4:1994224
Soriano, L., Galan, L., Rueda, F. (1990) An XPS study of Cs2Te photocathode materials. Surface and Interface Analysis, 16 (1). 193-198 doi:10.1002/sia.740160138
Lynch, J., Rahbari, R., Lee, L. T., Bisiaux, M., Lecourtier, J., Chauveteau, G. (1990) XPS study of ion adsorption on siliceous surfaces. Surface and Interface Analysis, 16 (1). 471 doi:10.1002/sia.740160199
Prieto, P., Galán, L., Sanz, J. M., Rueda, F. (1990) An XPS study of the kinetics of dissolution of ZrO2 in α-Zr. Surface and Interface Analysis, 16 (1). 535-539 doi:10.1002/sia.7401601111
Gautier, M., Duraud, J.P., Pham Van, L. (1991) Influence of the Al2O3(0001) surface reconstruction on the Cu/Al2O3 interface. Surface Science Letters, 249 (1). doi:10.1016/0167-2584(91)90115-8
Douillard, L, Jollet, F, Bellin, C, Gautier, M, Duraud, J P (1994) The electronic structure of KNbO3: an XPS and XAS study. Journal of Physics: Condensed Matter, 6 (27). 5039-5052 doi:10.1088/0953-8984/6/27/013
Gautier, M., Thromat, N., Duraud, J. P., Le Gressus, C., Henriot, M., Liang, K., Orange, G., Fantozzi, G. (1990) Influence of surface defects on the mechanical properties of yttria ceramics. Surface and Interface Analysis, 16 (1). 467-468 doi:10.1002/sia.740160196
 
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