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Cumpson, Peter J. (1993) Elastic scattering corrections in AES and XPS: I. Two rapid Monte Carlo methods for calculating the depth distribution function. Surface and Interface Analysis, 20 (8). 727-741 doi:10.1002/sia.740200818

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Reference TypeJournal (article/letter/editorial)
TitleElastic scattering corrections in AES and XPS: I. Two rapid Monte Carlo methods for calculating the depth distribution function
JournalSurface and Interface Analysis
AuthorsCumpson, Peter J.Author
Year1993 (July)Volume20
Issue8
PublisherWiley
DOIdoi:10.1002/sia.740200818Search in ResearchGate
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Mindat Ref. ID6504331Long-form Identifiermindat:1:5:6504331:8
GUID0
Full ReferenceCumpson, Peter J. (1993) Elastic scattering corrections in AES and XPS: I. Two rapid Monte Carlo methods for calculating the depth distribution function. Surface and Interface Analysis, 20 (8). 727-741 doi:10.1002/sia.740200818
Plain TextCumpson, Peter J. (1993) Elastic scattering corrections in AES and XPS: I. Two rapid Monte Carlo methods for calculating the depth distribution function. Surface and Interface Analysis, 20 (8). 727-741 doi:10.1002/sia.740200818
In(1993, July) Surface and Interface Analysis Vol. 20 (8) Wiley

See Also

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Dwyer, V. M., Richards, J. M. (1993) Exact analytical solutions and close approximations to the depth distribution function in AES and XPS. Surface and Interface Analysis, 20 (4). 271-275 doi:10.1002/sia.740200402
Dwyer, V. M. (1993) Reconstruction of the depth profile from angle-resolved AES/XPS. Surface and Interface Analysis, 20 (8). 687-695 doi:10.1002/sia.740200813
Jablonski, Aleksander (1989) Elastic scattering and quantification in AES and XPS. Surface and Interface Analysis, 14 (11). 659-685 doi:10.1002/sia.740141102
Pavlyák, F., Bertóti, I., Mohai, M., Biczó, I., Giber, J. (1993) AES and XPS characterization of SiNxlayers. Surface and Interface Analysis, 20 (3). 221-227 doi:10.1002/sia.740200306
Cumpson, P. J., Seah, M. P. (1997) Elastic Scattering Corrections in AES and XPS. II. Estimating Attenuation Lengths and Conditions Required for their Valid Use in Overlayer/Substrate Experiments. Surface and Interface Analysis, 25 (6). 430-446 doi:10.1002/(sici)1096-9918(199706)25:6<430::aid-sia254>3.0.co;2-7
Grant, J. T. (1989) Methods for quantitative analysis in XPS and AES. Surface and Interface Analysis, 14 (6). 271-283 doi:10.1002/sia.740140602
Dwyer, V. M., Richards, J. M. (1992) The depth distribution function in Auger/XPS analysis. Surface and Interface Analysis, 18 (7). 555-560 doi:10.1002/sia.740180717
Cumpson, P. J., Seah, M. P. (1992) Random uncertainties in AES and XPS: I: Uncertainties in peak energies, intensities and areas derived from peak synthesis. Surface and Interface Analysis, 18 (5). 345-360 doi:10.1002/sia.740180508
Cumpson, P. J. (1997) Elastic Scattering Corrections in AES and XPS. III. Behaviour of Electron Transport Mean Free Path in Solids for Kinetic Energies in the Range 100 eVSurface and Interface Analysis, 25 (6). 447-453 doi:10.1002/(sici)1096-9918(199706)25:6<447::aid-sia272>3.0.co;2-q
Seah, M. P., Gilmore, I. S. (2001) Simplified equations for correction parameters for elastic scattering effects in AES and XPS forQ, ? and attenuation lengths. Surface and Interface Analysis, 31 (9). 835-846 doi:10.1002/sia.1113
Cumpson, P. J., Seah, M. P. (1992) Random uncertainties in AES and XPS: II: Quantification using either relative or absolute measurements. Surface and Interface Analysis, 18 (5). 361-367 doi:10.1002/sia.740180509
 
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