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Arezzo, F., Severini, E., Zacchetti, N. (1994) An XPS study of diamond films grown on differently pretreated silicon substrates. Surface and Interface Analysis, 22 (1). 218-223 doi:10.1002/sia.740220149

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Reference TypeJournal (article/letter/editorial)
TitleAn XPS study of diamond films grown on differently pretreated silicon substrates
JournalSurface and Interface Analysis
AuthorsArezzo, F.Author
Severini, E.Author
Zacchetti, N.Author
Year1994 (July)Volume22
Issue1
PublisherWiley
DOIdoi:10.1002/sia.740220149Search in ResearchGate
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Mindat Ref. ID6504875Long-form Identifiermindat:1:5:6504875:7
GUID0
Full ReferenceArezzo, F., Severini, E., Zacchetti, N. (1994) An XPS study of diamond films grown on differently pretreated silicon substrates. Surface and Interface Analysis, 22 (1). 218-223 doi:10.1002/sia.740220149
Plain TextArezzo, F., Severini, E., Zacchetti, N. (1994) An XPS study of diamond films grown on differently pretreated silicon substrates. Surface and Interface Analysis, 22 (1). 218-223 doi:10.1002/sia.740220149
In(1994, July) Surface and Interface Analysis Vol. 22 (1) Wiley

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De Laet, J., De Boeck, K., Terryn, H., Vereecken, J. (1994) Determination of the depth resolution of Auger electron spectroscopy depth profiles of anodic barrier oxide films on differently pretreated aluminium substrates. Surface and Interface Analysis, 22 (1). 175-180 doi:10.1002/sia.740220139
Paparazzo, E., Fierro, G., Ingo, G. M., Zacchetti, N. (1988) XPS studies on the surface thermal modifications of tin oxides. Surface and Interface Analysis, 12 (7). 438-439 doi:10.1002/sia.740120720
Ciampi, S., Di Castro, V. (1994) The influence of Al oxidation on the Cu/Al2O3 interface formation: An XPS study. Surface and Interface Analysis, 22 (1). 594-597 doi:10.1002/sia.7402201126
Ishitani, A., Nonaka, T. (1994) Preparation and characterization of organic superlattice thin films grown on hydrogenated silicon single-crystal substrates. Surface and Interface Analysis, 21 (6). 356-364 doi:10.1002/sia.740210606
Ingo, G. M., Paparazzo, E., Bagnarelli, O., Zacchetti, N. (1990) XPS studies on cerium, zirconium and yttrium valence states in plasma-sprayed coatings. Surface and Interface Analysis, 16 (1). 515-519 doi:10.1002/sia.7401601107
Petkov, K., Krastev, V., Marinova, Ts. (1994) XPS study of amorphous As2S3 films deposited onto chromium layers. Surface and Interface Analysis, 22 (1). 202-205 doi:10.1002/sia.740220145
Arezzo, F., Zacchetti, N., Zhu, W. (1994) X‐ray photoelectron spectroscopy study of substrate surface pretreatments for diamond nucleation. Journal of Applied Physics, 75 (10). 5375-5381 doi:10.1063/1.355692
Garbassi, F., Morra, M., Occhiello, E., Pozzi, L. (1994) The use of XPS valence band spectra in the study of plasma-deposited polymeric films of tetramethyldisiloxane or hydroxyethylmethacrylate. Surface and Interface Analysis, 22 (1). 485-490 doi:10.1002/sia.7402201103
Santiago, F., Mansour, A. N., Lee, R. N. (1987) XPS study of sizing removal from carbon fibers. Surface and Interface Analysis, 10 (1). 17-22 doi:10.1002/sia.740100105
Stoch, A., Stoch, J., Rakowska, A. (1994) An XPS and SEMS study of silica sol-gel/metal substrate interaction. Surface and Interface Analysis, 22 (1). 242-247 doi:10.1002/sia.740220153
Ingo, G. M., Zacchetti, N., Della Sala, D., Coluzza, C. (1988) XPS investigation on amorphous silion nitride (a-SiNx) chemical structure. Surface and Interface Analysis, 12 (5). 323-324 doi:10.1002/sia.740120511
 
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