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Chawla, Vipin, Holec, David, Mayrhofer, Paul H. (2012) Interfacial coherency stress distribution in TiN/AlN bilayer and multilayer films studied by FEM analysis. Computational Materials Science, 55. 211-216 doi:10.1016/j.commatsci.2011.11.024

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Reference TypeJournal (article/letter/editorial)
TitleInterfacial coherency stress distribution in TiN/AlN bilayer and multilayer films studied by FEM analysis
JournalComputational Materials Science
AuthorsChawla, VipinAuthor
Holec, DavidAuthor
Mayrhofer, Paul H.Author
Year2012 (April)Volume55
PublisherElsevier BV
DOIdoi:10.1016/j.commatsci.2011.11.024Search in ResearchGate
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Mindat Ref. ID9506901Long-form Identifiermindat:1:5:9506901:2
GUID0
Full ReferenceChawla, Vipin, Holec, David, Mayrhofer, Paul H. (2012) Interfacial coherency stress distribution in TiN/AlN bilayer and multilayer films studied by FEM analysis. Computational Materials Science, 55. 211-216 doi:10.1016/j.commatsci.2011.11.024
Plain TextChawla, Vipin, Holec, David, Mayrhofer, Paul H. (2012) Interfacial coherency stress distribution in TiN/AlN bilayer and multilayer films studied by FEM analysis. Computational Materials Science, 55. 211-216 doi:10.1016/j.commatsci.2011.11.024
In(n.d.) Computational Materials Science Vol. 55. Elsevier BV

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Chawla, Vipin, Holec, David, Mayrhofer, Paul H (2013) Stabilization criteria for cubic AlN in TiN/AlN and CrN/AlN bi-layer systems. Journal of Physics D: Applied Physics, 46. 45305pp. doi:10.1088/0022-3727/46/4/045305
Chawla, Vipin, Jayaganthan, R., Chandra, Ramesh (2010) Microstructural and mechanical properties of sputter deposited TiN/SiNx multilayer thin films. Materials Chemistry and Physics, 122. 424-430 doi:10.1016/j.matchemphys.2010.03.018
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Zhang, Zaoli, Gu, Xunlong, Holec, David, Bartosik, Matthias, Mayrhofer, Paul H., Duan, H. P. (2017) Superlattice-induced oscillations of interplanar distances and strain effects in the CrN/AlN system. Physical Review B, 95 (15) doi:10.1103/physrevb.95.155305
Holec, David, Franz, Robert, Mayrhofer, Paul H, Mitterer, Christian (2010) Structure and stability of phases within the NbN–AlN system. Journal of Physics D: Applied Physics, 43. 145403pp. doi:10.1088/0022-3727/43/14/145403
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Wang, J.S., Zheng, X.J., Zheng, H., Song, S.T., Zhu, Z. (2010) Identification of elastic parameters of transversely isotropic thin films by combining nanoindentation and FEM analysis. Computational Materials Science, 49 (2). 378-385 doi:10.1016/j.commatsci.2010.05.025
 
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