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Hotz, M T, Martis, J, Radlicka, T, Bacon, N J, Dellby, N, Lovejoy, T C, Quillin, S C, Hwang, H Y, Singh, P, Krivanek, O L (2023) Atomic Resolution SE Imaging in a 30-200 keV Aberration-corrected UHV STEM. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 2064-2065 doi:10.1093/micmic/ozad067.1068

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Reference TypeJournal (article/letter/editorial)
TitleAtomic Resolution SE Imaging in a 30-200 keV Aberration-corrected UHV STEM
JournalMicroscopy and Microanalysis
AuthorsHotz, M TAuthor
Martis, JAuthor
Radlicka, TAuthor
Bacon, N JAuthor
Dellby, NAuthor
Lovejoy, T CAuthor
Quillin, S CAuthor
Hwang, H YAuthor
Singh, PAuthor
Krivanek, O LAuthor
Year2023 (July 22)Volume29
PublisherOxford University Press (OUP)
DOIdoi:10.1093/micmic/ozad067.1068Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID16637037Long-form Identifiermindat:1:5:16637037:9
GUID0
Full ReferenceHotz, M T, Martis, J, Radlicka, T, Bacon, N J, Dellby, N, Lovejoy, T C, Quillin, S C, Hwang, H Y, Singh, P, Krivanek, O L (2023) Atomic Resolution SE Imaging in a 30-200 keV Aberration-corrected UHV STEM. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 2064-2065 doi:10.1093/micmic/ozad067.1068
Plain TextHotz, M T, Martis, J, Radlicka, T, Bacon, N J, Dellby, N, Lovejoy, T C, Quillin, S C, Hwang, H Y, Singh, P, Krivanek, O L (2023) Atomic Resolution SE Imaging in a 30-200 keV Aberration-corrected UHV STEM. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 2064-2065 doi:10.1093/micmic/ozad067.1068
In(2023) Microscopy and Microanalysis Vol. 29. Cambridge University Press (CUP)

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Dellby, N, Quillin, S C, Krivanek, O L, Hrncirik, P, Mittelberger, A, Plotkin-Swing, B, Lovejoy, T C (2023) Ultra-high Resolution EELS Analysis and STEM Imaging at 20 keV. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 626-627 doi:10.1093/micmic/ozad067.305
Plotkin-Swing, B, Mittelberger, A, Haas, B, Idrobo, J C, Graner, B, Dellby, N, Hotz, M T, Meyer, C E, Quillin, S C, Krivanek, O L, Lovejoy, T C (2023) Ultra-high Energy Resolution EELS and 4D STEM at Cryogenic Temperatures. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 1698-1699 doi:10.1093/micmic/ozad067.875
Plotkin-Swing, B, Martis, J, Su, C, Hotz, M T, Dellby, N, RadliÄŤka, T, Krivanek, O L, Lovejoy, T C (2024) Atomic Resolution Secondary Electron Imaging of Top and Bottom Surfaces. Microscopy and Microanalysis, 30. doi:10.1093/mam/ozae044.731
Johnson, C W, Hotz, M T, Krivanek, O L, Dellby, N, Corbin, G J, Martis, J, Mittelberger, A, Plotkin-Swing, B, Quillin, S C, Lovejoy, T C (2024) Ultra-High Energy Resolution EELS Beyond Room Temperature. Microscopy and Microanalysis, 30. doi:10.1093/mam/ozae044.677
Martis, J, Plotkin-Swing, B, Haas, B, Susi, T, Hotz, M T, Krivanek, O L, Dellby, N, Mittelberger, A, Quillin, S C, Lovejoy, T C (2024) STEM Developments: A Versatile Light Injector/Collector, Fast 4D-STEM, and High Energy Resolution EELS without Compromising Beam Current. Microscopy and Microanalysis, 30. doi:10.1093/mam/ozae044.1083
Plotkin-Swing, B; Martis, J; Dellby, N; Humphry, M J; Lovejoy, T C; Krivanek, O L (2025) STEM for Biological Low Dose Structure Imaging. Microscopy and Microanalysis, 31. doi:10.1093/mam/ozaf048.493
Haas, Benedikt, Radtke, Guillaume, Quillin, Steven C, Lovejoy, Tracy C, Dellby, Niklas, Krivanek, Ondrej L, Hammud, Adnan, Schröder, Tim, Koch, Christoph T (2023) Mapping Phonon Dispersion Surfaces at Nanometer Scale. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 356-357 doi:10.1093/micmic/ozad067.166
Krivanek, O, Dellby, N, Murfitt, M, Bacon, N, Corbin, G, Hrncirik, P, Nelson, J, Lovejoy, T, Skone, G, Szilagyi, Z (2011) Improving the Spatial and Energy Resolution of Aberration-Corrected STEM. Microscopy and Microanalysis, 17. 1290-1291 doi:10.1017/s143192761100732x
Hwang, Sooyeon (2023) Secondary Electron Imaging on Aberration-Corrected STEM for Characterizing Catalyst Materials. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 764-765 doi:10.1093/micmic/ozad067.377
Bacon, N J, Corbin, G J, Dellby, N, Hrncirik, P, Krivanek, O L, McManama-Smith, A, Murfitt, M F, Szilagyi, Z S (2005) Nion UltraSTEM: An Aberration-Corrected STEM for Imaging and Analysis. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605509802
KRIVANEK, O.L., LOVEJOY, T.C., DELLBY, N. (2015) Aberration-corrected STEM for atomic-resolution imaging and analysis. Journal of Microscopy, 259 (3). 165-172 doi:10.1111/jmi.12254
 
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