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Hwang, Sooyeon (2023) Secondary Electron Imaging on Aberration-Corrected STEM for Characterizing Catalyst Materials. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 764-765 doi:10.1093/micmic/ozad067.377

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Reference TypeJournal (article/letter/editorial)
TitleSecondary Electron Imaging on Aberration-Corrected STEM for Characterizing Catalyst Materials
JournalMicroscopy and Microanalysis
AuthorsHwang, SooyeonAuthor
Year2023 (July 22)Volume29
PublisherOxford University Press (OUP)
DOIdoi:10.1093/micmic/ozad067.377Search in ResearchGate
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Mindat Ref. ID16637089Long-form Identifiermindat:1:5:16637089:8
GUID0
Full ReferenceHwang, Sooyeon (2023) Secondary Electron Imaging on Aberration-Corrected STEM for Characterizing Catalyst Materials. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 764-765 doi:10.1093/micmic/ozad067.377
Plain TextHwang, Sooyeon (2023) Secondary Electron Imaging on Aberration-Corrected STEM for Characterizing Catalyst Materials. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 764-765 doi:10.1093/micmic/ozad067.377
In(2023) Microscopy and Microanalysis Vol. 29. Cambridge University Press (CUP)

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Egerton, Ray, Hwang, Sooyeon, Zhu, Yimei (2023) Atomic-scale Secondary-electron Imaging in the STEM and SEM. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 452-453 doi:10.1093/micmic/ozad067.212
Klie, Robert F (2023) Analytical Characterization of Functional Materials using Cryo-FIB/SEM and Aberration-corrected Cryo-STEM. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 1702-1703 doi:10.1093/micmic/ozad067.877
Sawant, Ronit, Yang, Shize, Carpenter, R W (2023) High-Resolution Composition Wave Characterization in Cu-Ti Alloys using Aberration Corrected STEM. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 1781-1783 doi:10.1093/micmic/ozad067.922
Shao, Yu-Tsun, Zuo, Jian-Min, Muller, David A (2023) Principles and Applications of 4D-STEM Diffraction Imaging for Characterizing Complex Crystalline Materials. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 2103 doi:10.1093/micmic/ozad067.1089
Pattison, Alexander J, Noack, Marcus, Ercius, Peter (2023) Automating STEM Aberration Correction via Bayesian Optimization. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 1881-1882 doi:10.1093/micmic/ozad067.971
Griffin, Brendan J (2023) Secondary Electron Imaging, Variable Pressure (ESEM), Helium Ion Microscopy and Kangaroos - My Perspective of David Joy!. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 450-451 doi:10.1093/micmic/ozad067.211
Matsumoto, Hiroaki, Sato, Takeshi, Igarashi, Keisuke, Hashimoto, Takahito, Inada, Hiromi (2023) In-situ Observation of Chemically Reacted Particles in Gas Atmosphere with an Aberration Corrected STEM/SEM. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 122-123 doi:10.1093/micmic/ozad067.054
Zhang, Minghao (2023) Development of Cryogenic Techniques for Characterizing Energy Storage Materials in Electrochemical Process. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 1934 doi:10.1093/micmic/ozad067.1001
Aoki, Toshihiro, Sawada, Hidetaka, Du, Chaojie, Pan, Xiaoqing (2023) Quickly Switchable Angular and Spatially Resolved Cs-corrected STEM. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 348-349 doi:10.1093/micmic/ozad067.162
Hotz, M T, Martis, J, Radlicka, T, Bacon, N J, Dellby, N, Lovejoy, T C, Quillin, S C, Hwang, H Y, Singh, P, Krivanek, O L (2023) Atomic Resolution SE Imaging in a 30-200 keV Aberration-corrected UHV STEM. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 2064-2065 doi:10.1093/micmic/ozad067.1068
Peet, Mathew, Henderson, Richard, Russo, Christopher (2023) Measuring Electron Dose Efficiency in TEM and STEM. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 1012 doi:10.1093/micmic/ozad067.509
 
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